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Keysight Technologies Accelerates Design Workflows with New PathWave Design 2020 Software Suite
Keysight announces PathWave Design 2020, which includes the latest releases of Keysight's electronic design automation software to accelerate design workflows for radio frequency (RF) and microwave, 5G, and automotive design engineers.

Press Materials 2019-06-03

Improved Data Sharing Across Product Development Workflow Would Improve Time to Market
Keysight Survey Reveals Improved Data Sharing Across the Entire Product Development Workflow Would Improve Time to Market for Electronic Devices.

Press Materials 2019-04-08

Keysight Collaborates with Leading Research Centers to Reach Milestone in Low-Freq. Noise Measurment
Keysight announces it has reached a new milestone in low-frequency noise measurements through its work with leading research centers in Europe, Middle East, Africa and India (EMEAI). Using the new Advanced Low-Frequency Noise Analyzer (A-LFNA) and WaferPro Express software, designers can now measure noise more accurately in an even broader range of electronic devices.

Press Materials 2018-02-05

Cascade Microtech Releases 1/f Measurement Solution With Keysight Technologies
Cascade Microtech announces the release of a comprehensive low-frequency noise measurement solution for device modeling, characterization and reliability testing with MeasureOne solution partner Keysight Technologies.

Press Materials 2016-08-04

Keysight Seamlessly Integrates Low-Frequency Noise Measurements in Wafer Level Solution Platform
New Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers.

Press Materials 2016-07-19

Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

Press Materials 2015-08-20

Dialog Semiconductor adopts IC-CAP, MBP, MQA, and WaferPro Express software
Keysight announces that Dialog Semiconductor has adopted the Keysight EEsof EDA IC-CAP, MBP, MQA, and WaferPro Express software to perform foundry technology characterization, model validation, model customization and enhancement.

Press Materials 2015-05-11

Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization
Keysight announces WaferPro Express 2015, a measurement software platform for the automated characterization of wafer-level devices and circuit components.

Press Materials 2015-04-28

Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

Press Materials 2015-04-16

Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

Press Materials 2014-06-03

Agilent Technologies Unveils New IC-CAP Platform for Device Characterization and Modeling
Agilent announces the latest release of its device modeling software platform, the Integrated Circuit Characterization and Analysis Program (IC-CAP).

Press Materials 2012-12-18

Agilent Technologies Ships Latest IC-CAP Platform for DC and RF Device Characterization and Modeling
Software improves modeling flow with link between measurement and extraction

Press Materials 2011-05-10

Agilent Introduces IC-CAP WaferPro Software for Automating Complex Device Modeling Applications
IC-CAP WaferPro provides a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications.

Press Materials 2010-08-19

Agilent Software Enables Successful Development of Hua Hong NEC's RF Device Modeling Platform

Press Materials 2010-06-11