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Innovations in EDA Webcast Library
EEsof EDA series of webcasts, upcoming and recorded

網路廣播

What's New in WaferPro Express 2019 Update 1.0
Overview of what's new in WaferPro Express 2019 Update 1.0.

訓練教材 2019-06-18

PDF PDF 2.22 MB
Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

研討會講義 2017-08-14

Keysight EEsof EDA 客戶教育和服務
Keysight EDA 客戶教育和服務概述。

訓練教材 2017-08-08

Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

研討會講義 2016-12-21

PDF PDF 2.35 MB
WaferPro Express 2016.04 Key Features and What's New
Overview of what's new in WaferPro Express 2016.04.

訓練教材 2016-07-12

PDF PDF 1.79 MB
是德科技 EEsof EDA 客戶教育訓練與服務
簡要介紹是德科技 EEsof EDA 客戶教育訓練與服務。

訓練教材 2016-04-19

DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

網路廣播 -- 存檔

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

網路廣播 -- 存檔

是德科技 EEsof EDA 客戶教育訓練與服務
簡要介紹是德科技 EEsof EDA 客戶教育訓練與服務

訓練教材 2010-08-11