Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Technical Support

Device Modeling Products

Support by Product Model Number:

1-10 of 10

Sort:
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

Webcast - recorded

Keysight MQA And MBP Tools For Effective Device Modeling And Verification
This Webcast introduces two software packages which help to obtain the most reliable modeling results for electronic devices (e.g. MOS transistors): fitting measurement data and also verifying the robustness of the obtained model.

Webcast

Innovations in EDA Webcast Library
EEsof EDA series of webcasts, upcoming and recorded

Webcast

What's New in WaferPro Express 2019 Update 1.0
Overview of what's new in WaferPro Express 2019 Update 1.0.

Training Materials 2019-06-18

PDF PDF 2.22 MB
Keysight EEsof EDA Customer Education and Services
Brief overview of Keysight EDA Customer Education and Services.

Training Materials 2019-04-06

Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

Seminar Materials 2017-08-14

Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Seminar Materials 2016-12-21

PDF PDF 2.35 MB
WaferPro Express 2016.04 Key Features and What's New
Overview of what's new in WaferPro Express 2016.04.

Training Materials 2016-07-12

PDF PDF 1.79 MB
Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Seminar Materials 2013-10-22

Keysight Wireless Test & Design World 2009 in Seoul, Korea
Keysight EEsof EDA related materials presented at the Keysight Wireless Test & Design World 2009

Seminar Materials 2009-07-01