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Innovations in EDA Webcast Library
EEsof EDA series of webcasts, upcoming and recorded

웹캐스트

What's New in WaferPro Express 2019 Update 1.0
Overview of what's new in WaferPro Express 2019 Update 1.0.

교육 자료 2019-06-18

PDF PDF 2.22 MB
Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

세미나 프리젠테이션 2017-08-14

키사이트 EEsof EDA 고객 교육 및 서비스
키사이트 EDA 고객 교육 및 서비스에 대한 간략한 개요

교육 자료 2017-08-08

Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

세미나 프리젠테이션 2016-12-21

PDF PDF 2.35 MB
WaferPro Express 2016.04 주요 특징과 새로운 기능(영어)
WaferPro Express 2016.04의 새로운 기능에 대한 개요

교육 자료 2016-07-12

PDF PDF 1.79 MB
WaferPro Express 2016.04 Key Features and What's New
Overview of what's new in WaferPro Express 2016.04.

교육 자료 2016-07-12

PDF PDF 1.79 MB
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast
Original broadcast September 4, 2014

웹캐스트 - recorded

Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast
Original broadcast May 7, 2013

웹캐스트 - recorded

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

웹캐스트 - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

웹캐스트 - recorded

MQA: Automating Library Validation
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

세미나 프리젠테이션 2013-10-22

PDF PDF 1.48 MB
Automating SPICE Library Validation
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

세미나 프리젠테이션 2013-10-22

Measurement Based FET Modeling using Artifical Neural Networks (ANN)
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

세미나 프리젠테이션 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

세미나 프리젠테이션 2011-06-22

PDF PDF 3.07 MB
Automating On-Wafer Measurements with the New Agilent IC-CAP WaferPro
Webcast slides describing on-wafer semiconductor device measurement challenges and WaferPro

세미나 프리젠테이션 2011-01-27

PDF PDF 1.05 MB
Agilent Wireless Test & Design World 2009 in Seoul, Korea
Agilent EEsof EDA related materials presented at the Agilent Wireless Test & Design World 2009

세미나 프리젠테이션 2009-07-01