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Physical Layer Test System (PLTS) 2020 - Technical Overview
The new Physical Layer Test System (PLTS) 2020 is the industry standard for signal integrity measurements and data post processing of high-speed interconnects, such as cables, backplanes, PCBs and connectors.

Technical Overview 2020-07-13

PDF PDF 2.39 KB
Tested PC and PXI/AXIe Chassis Configurations - Technical Overview
This document provides a list of personal computers which are compatible with the M9005A, M9010A, M9018B, M9019A PXIe Chassis and the M9502A, M9505A, M9506A, M9514A AXIe Chassis.

Technical Overview 2020-05-11

PDF PDF 1 MB
BIOS and Windows Settings for Modular Systems - Technical Overview
This technical note provides the detailed BIOS and Windows settings for modular systems using the tested computers that are compatible with Keysight Technologies, Inc. PXI/AXIe chassis.

Technical Overview 2020-04-30

PDF PDF 531 KB
Quantum Engineering Toolkit (QET) - Data Sheet
Keysight's Quantum Engineering Toolkit (QET) provides control sequence development that manipulates the signal path and complements APIs and Hard Virtual Instrumentation (HVI) controls.

Data Sheet 2019-11-22

PDF PDF 2.73 MB
Keysight S9100A 5G Base Station Manufacturing Test Solution - Data Sheet
Data sheet for Keysight S9100A 5G Base Station Manufacturing Test Solution

Data Sheet 2019-06-13

PDF PDF 591 KB
Physical Layer Test System (PLTS) 2018 - Technical Overview
The PLTS software, with rapid crosstalk analysis and customizable device configuration mapping, makes multiple board turns a thing of the past. This technical overview covers basic information such as why physical layer testing is important, advanced signal integrity topics, and how the software guides the user through hardware setup and calibration, and controls the data acquisition.

Technical Overview 2018-01-18

Designing Scalable 10G Backplane Interconnect Systems
This Paper presents techniques for design which significantly reduce modeling requirements for the design of high-speed backplanes in conjunction with advanced testing techniques which provide maximum channel characterization with the minimum amount of time.

Technical Overview 2012-05-05

PDF PDF 1.46 MB