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Make accurate and fast design decisions with data analytics
Make accurate and fast design decisions with data analytics

文章 2017-08-25

使用 ENA 系列网络分析仪的无线电力传输效率测试
ENA 系列网络分析仪的选件 006 无线电力传输分析软件能够实时执行无线电力传输效率测量。高级 2D/3D 仿真特性可显示负载阻抗的相关性。

文章 2016-06-30

Signal Integrity Tips and Techniques Using TDR, VNA and Modeling - Article Reprint
Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

文章 2016-03-31

PDF PDF 644 KB
使用 ENA 系列网络分析仪执行无线功率传输效率测试
ENA 系列网络分析仪中的选件 006 无线功率传输分析软件能够实时进行无线功率传输效率测量。先进的 2D/3D 仿真特性可以显示负载阻抗的关系。

文章 2015-09-25

Faster Testing with High-Performance Spectrum Analysis in a VNA - Article Reprint
Article reprint from the June 2015 issue of Microwave Journal highlighting the new spectrum analyzer option for the PNA Series.

文章 2015-06-01

PDF PDF 1.23 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

文章 2014-06-14

PDF PDF 515 KB
High-Speed Data Throughput Test
Ensure a quality user experience by fully testing the packet data performance of your wireless device early in the design cycle. The 8960 offers the highest 2G/3G/3.5G data rates and real-world testing to find issues sooner and resolve them faster!

专访 2011-11-29

Solutions for Nonlinear Characterization of High-Power Amplifiers - Article
The article was written by Keith Anderson and published in the Wireless Design magazine

文章 2011-05-02

EE Times: Time-domain simulations of high-speed links with X parameters

文章 2011-03-29

X-parameters: Commercial implementations of the latest technology enable mainstream applications
This blog article from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters.

文章 2011-01-06

Real-World Battery Drain Analysis
Go beyond Talk Time Test! Test the battery life of your data device using realistic user scenarios to ensure real-world operation meets user expectations with the 8960, 14565B and IFT software.

专访 2010-08-30

X-parameters Aid MMIC Design
Microwaves & RF article on how models based X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.

期刊 2010-07-15

Fundamentally Changing Nonlinear Microwave Design
Provides an overview of the invention and need for X-parameters to model the behavior of non-linear devices. This is an article was originally from Microwave Journal, Issue March 2010, Vol.53. No.3

专访 2010-03-09

Validating the Physical and Protocol Layers in DDR Memory Interfaces

文章 2009-01-06

Eye-Diagram Analysis Speeds DDR SDRAM Validation

文章 2009-01-06

Electronic Products - 2008 Product of the Year Award
Analyzer changes fundamental way communications networks are designed

文章 2009-01-01

Simplify DDR Validation with SI Methods

文章 2008-01-06

Testing HSUPA devices
By: Jeanne Fightmaster, Agilent Technologies Published with permissions of EETimes Asia

文章 2007-11-16

PDF PDF 404 KB
New measurement option expands Agilent’s leadership in noise figure analysis
There are many choices today for performing noise figure measurements of LNAs and transistors. The new PNA-X source-corrected method offers a technique that provides the most accurate noise figure measurements available today.

文章 2007-11-01

PDF PDF 1.05 MB
How to test UMA/GAN-enabled mobile phones
By Jamie Allan and John Russell, Agilent Technologies Published with permissions of Mobile Handset DesignLine

文章 2007-10-29

Evaluating data transfer in HSDPA/W-CDMA nets
Published with permission from Global Sources October 2007

文章 2007-10-15

PDF PDF 2.84 MB
Going Beyond S-parameters with an Advanced Architecture for Vector Network Analysis

文章 2007-07-26

PDF PDF 624 KB
Efficere Technologies Develops World Class Test Fixtures
Read about Efficere’s design success using Keysight’s PLTS software, E8364B PNA and N1930A test set

案例分析 2006-11-29

PDF PDF 297 KB
Logic Analysis Application Suite targets High-Speed FPGA, Wireless and Multilane Serial Applications

专访 2006-05-31

PDF PDF 27 KB