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TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2019-07-03

How to build a fixture for use with the Keysight Cover-Extend Technology
Cover-Extend Technology is Keysight’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2017-12-05

Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2017-12-02

PDF PDF 1.89 MB
Medalist i3070 Test Throughput Optimization - Application Note
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2017-06-16

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

PDF PDF 435 KB
Programming Micron P8P PCM Flash Using Serial Peripheral Interface (SPI)
The Micron P8P phase change memory has a new serial peripheral interface to enable low cost, low pin count on-board programming using the Keysight Medalist i3070 in-circuit test solution.

Application Note 2010-04-01

PDF PDF 207 KB
Vectorless Test Solutions --An analysis of performance differences between VTEP
This white paper provides an analysis of performance differences between Keysight VTEP, FrameScan FX and TestJet Enhanced technologies.

Application Note 2009-11-03

PDF PDF 214 KB
Network Parameter Measurement: Best Practices using the Keysight Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Keysight Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Keysight Medalist i3070 ICT, collectively known Super 7 suite.

Application Note 2009-03-06

Enhanced Log Records for the Keysight Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04

PDF PDF 801 KB
IEEE 1149.6 Standard Boundary Scan Testing on Keysight Medalist i3070 ICT Systems
This paper introduces the latest advancements in Boundary Scan test capabilities on the Keysight Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

Application Note 2008-11-24

PDF PDF 297 KB
Comparing Contact Performance on PCBA using Conventional Testpads and Bead Probe
This white paper captures the details of an evaluation performed on the notebook motherboard of a leading Original Equipment Manufacturer using Keysight Medalist Bead Probes Technology.

Application Note 2008-10-31

PDF PDF 428 KB
First pass Yield (FPY) and Alarm Triggers on the Keysight Medalist i3070 In-circuit Test System
This application note will explain some customizations and how to create alarm triggers.

Application Note 2008-09-26

PDF PDF 131 KB
Slashing Debugging time with the Keysight Medalist i3070 In-Circuit Test AutoDebug Tool
This app note provides an overview of the AutoDebug tool on the Keysight Medalist i3070 In-Circuit Test Software version 07.00.

Application Note 2008-09-01

Displaying menus in two languages on Keysight Medalist i3070 Graphical User Inter
This application note describes how users of the Keysight Medalist i3070 In-Circuit Test system can enable the menu-driven user interface to display the menu items in two languages.

Application Note 2008-08-14

High Node Count Fixturing Solutions for Keysight Short-Wire Test Fixtures
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Keysight 3070 family of board test systems.

Application Note 2008-04-30

PDF PDF 67 KB
Medalist 3070 and Medalist i5000 System Recovery using Retrospect Express
This app note describes how to perform backups of the system hard disk for the Keysight Medalist 3070 and Keysight Medalist i5000 In-circuit Test systems that have been shipped with Retrospect Express 7.0 and Roxio Digital Media Plus 7.2 software.

Application Note 2007-07-10

PDF PDF 628 KB
Maximising Test Coverage with Keysight Medalist VTEP v2.0
This paper describes how to get the most from Keysight Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

Application Note 2007-04-17

In-circuit Testing of Low Voltage Devices
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

Application Note 2005-05-25

PDF PDF 172 KB
Test and Inspection as Part of the Lead-free Manufacturing Process
The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies.

Application Note 2005-02-22

PDF PDF 421 KB
VTEP ROI Analysis
Discover how VTEP compares to existing technologies that are already in use worldwide.

Application Note 2004-10-04

VTEP Coverage Analysis
How much additional coverage can you really get with VTEP? The VTEP Coverage Analysis Tool provides a realistic estimate.

Application Note 2004-10-04

Safeguard and Low Voltage
Documents summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

Application Note 2004-08-30

The Importance of Test and Inspection When Implementing Lead-Free Manufacturing
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.

Application Note 2004-08-20

PDF PDF 260 KB
Using Lead-Free PCB Finishes at Manufacturing In-circuit Test Stage
The purpose of this document is to share experiences and educate engineers regarding different PCB surface finishes and the specific changes required in the PCB build process to allow for ICT.

Application Note 2004-08-08

PDF PDF 102 KB

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