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Fast Thermal Characterization and Testing Your Electronic Devices - White Paper
Fast thermal characterization and testing gives you the advantage of quick and qualitative insight into your products’ characteristics, the ability to troubleshoot and fine-tune the performance, and the capability to perform additional iterative testing. Learn how to predict and preview operating temperature performance of your product. Learn how to use a DAQ data acquisition system as a data logger to make temperature measurements on your product.

Application Note 2018-09-21

Temperature Data Logging: Making the right choice with a Data Acquisition System - White Paper
Consider using a DAQ as a temperature data logger due to its flexibility to make multiple temperature measurements, choice of sensor types with high accuracy, the ability to measure other signal types, easy to configure and automate testing without programming.

Application Note 2018-08-29

4 Things to Consider When Using a DAQ as a Data Logger
Product designs keep increasing in complexity. So do product test requirements. Learn how to improve test development cycle time, choose the right setup to optimize your test time, and improve the accuracy of your data acquisition test system.

Application Note 2018-08-07

How to Optimize Measurement Speed of Your DAQ - White Paper
This white paper will show you how to optimize the measurement speed of a midrange DAQ system, Keysight’s DAQ970A system, to meet most of your design validation tests. You will learn how to choose the right hardware and configuration settings that will help you optimize your measurement and transactional speed.

Application Note 2018-07-17

Practical Temperature Measurements (AN-290)
This application note explores the more common temperature measurement techniques and introduces procedures for improving their accuracy.

Application Note 2017-12-13

How to Characterize a DC-DC Converter Using a DAQ and BenchVue Software - Application Note
This application note provides an easy, step-by-step approach for measuring and plotting several characteristics of a DC-DC converter using Keysight’s 34970A/72A DAQs with BenchVue software.

Application Note 2017-05-04

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Application Note 2010-04-07

PDF PDF 486 KB
Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Application Note 2010-02-01

Migrating your Application Software from the 34970A to the 34972A
This white paper discusses how to migrate from existing applications that use the 34970A to the new 34972A Data Acquisition/Switch Unit.

Application Note 2010-01-29

PDF PDF 281 KB
Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Application Note 2009-10-22

Tips in Using Keysight GPIB Solutions in National Instrument’s LabVIEW Environment- Application Note
Tips for using Keysight GPIB solutions in National Instrument’s LabVIEW environment.

Application Note 2009-03-04

Simplified PC Connections for GPIB Instruments (AN 1409-1) - Application Note
Making the connection from your instruments to your PC has not always been an easy task. Today there are new choices that allow for easier connections so that you can focus on your measurement tasks and not on your connections. This paper will walk you through the choices you need to make when...

Application Note 2009-01-22

Application Note: Tips & Tricks for Using USB, GPIB, & LAN (AN 1465-20)
Application Note: Tips & Tricks for Connectivity

Application Note 2009-01-22

Responding to data logging events using action scripts
Combining data logging hardware and software can give you more techniques to automate extensive and repetitious measurements.

Application Note 2008-10-30

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Application Note 2008-10-30

PDF PDF 456 KB
Using USB and LAN I/O Converters - Application Note
Compare 3 instrument connectivity products to determine which interconnect device is best for your application needs.

Application Note 2008-07-09

PDF PDF 194 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Optimizing Test Systems for Highest Throughput, Lowest Cost and Easy LXI Instrument Integration
A new class of LXI instruments can save rack space, money and integration time over PXI. This application note discusses the tradeoffs and also explains how to optimize execution time through careful use of SCPI to avoid LAN latency issues.

Application Note 2006-03-23

LAN Connection using Telnet
When communicating with a LAN instrument using TELNET, do the following...

Application Note 2005-06-29

A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Application Note 2005-01-27

Direct instrument connection using LAN
If connecting directly to an instrument using LAN (rather than through a server) there are some steps that can be taken to make the initial connection faster and get you up-and-running more quickly.

Application Note 2004-11-01

Recognizing and Reducing Data Acquisition Switching Transients (AN 1444)
Unforeseen problems can occur when making sequential measurements with a data acquisition/switch unit or data logger. This application note can help you recognize, understand and resolve these problems associated with switching transients.

Application Note 2003-03-03

Maximizing the Life Span of Your Relays (AN 1399)
This application note tells you how to maximize your relay's potential life by selecting the right relays for the type of measurements you are making.

Application Note 2002-06-11

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