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Practical Temperature Measurements - Application Note
This application note explores the more common temperature measurement techniques and introduces procedures for improving their accuracy.

Nota de aplicação 2019-11-14

Recognizing and Reducing Data Acquisition Switching Transients - White Paper
Low impedance sources can produce large and fast current transients when switching; creating problems with adjacent channels, transients in the ground circuit that upset digital logic connected to the DUT, or causing the switch unit to reset or hang. This application note describes several techniques to reduce these switching transients.

Nota de aplicação 2019-09-27

Power Handling Capability of Electromechanical Switches
This application note discusses the power handling of the hot switching and cold switching of EM switches.

Nota de aplicação 2019-02-13

Temperature Measurement Solution for Solar Cell and Module Testing - Application Note
This application note highlights key products that can be used to help you effectively and efficiently test solar cells and solar modules, and ensure that they are able to perform optimally.

Nota de aplicação 2017-10-25

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Nota de aplicação 2014-07-31

Respondendo a eventos de registro de dados utilizando roteiros de ações
A combinação de hardware e software para o registro de dados coloca a seu dispor mais técnicas para automatizar medições extensivas e repetitivas.

Nota de aplicação 2012-04-20

Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Nota de aplicação 2010-04-07

Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Nota de aplicação 2010-02-01

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Nota de aplicação 2009-12-07

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Nota de aplicação 2009-10-22

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Nota de aplicação 2008-10-30

How Operating Life and Repeatability of Keysight’s EM Switches Minimize System Uncertainty
This application note discusses the effects of operating life and repeatability on coaxial electromechanical switches.

Nota de aplicação 2007-04-09

Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Nota de aplicação 2007-02-23

Optimizing Test Systems for Highest Throughput, Lowest Cost and Easy LXI Instrument Integration
A new class of LXI instruments can save rack space, money and integration time over PXI. This application note discusses the tradeoffs and also explains how to optimize execution time through careful use of SCPI to avoid LAN latency issues.

Nota de aplicação 2006-03-23

Optimizing Test System Throughput, Cost and Integration Time Using LAN-Based Instruments
This application note explains how to minimize latency when using LAN to control your instrumentation and explains why LAN is an excellent choice for cost savings and ease of integration.

Nota de aplicação 2006-01-09

LAN Connection using Telnet
When communicating with a LAN instrument using TELNET, do the following...

Nota de aplicação 2005-06-29

A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Nota de aplicação 2005-01-27

Direct instrument connection using LAN
If connecting directly to an instrument using LAN (rather than through a server) there are some steps that can be taken to make the initial connection faster and get you up-and-running more quickly.

Nota de aplicação 2004-11-01

Maximizing the Life Span of Your Relays (AN 1399)
This application note tells you how to maximize your relay's potential life by selecting the right relays for the type of measurements you are making.

Nota de aplicação 2002-06-11