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Keysight Technologies Expands the M8000 Series for 400 GbE
New 64 GBaud BERT Simplifies Accurate Characterization of PAM-4 and NRZ Devices

Материалы для прессы 2016-07-25

Keysight Technologies Expands its M8000 Series of BER Test Solutions for Multi-Channel Applications
Keysight Technologies introduced a multi-channel BERT solution based on a 14-slot AXIe mainframe for multi-lane testing. The BERT uses the latest version of the M8070A system software, version 3.0. The M8000 series of BER test solutions provide faster insight into multi-channel applications.

Материалы для прессы 2016-06-10

Keysight Technologies Expands the M8000 Series for 400 GbE - Press Release
Keysight Technologies, Inc. introduced a M8040A high-performance BERT for testing PAM-4 and NRZ devices that operate up to 64 GBaud. Engineers in validation labs and R&D who characterize receivers on the physical layer for the next generation of data center interconnects will benefit from simplified test setups and repeatable and accurate results.

Материалы для прессы 2016-05-18

Keysight Technologies Introduces MIPI® Receiver Test Software for PHY-Layer Standards
New Software Enables Automated Testing According to Conformance Test Suite for MIPI C-PHY 1.0 Standard

Материалы для прессы 2015-10-26

Keysight press release at ECOC, Valencia, September 2015
Keysight press release at ECOC, Valencia, September 2015

Материалы для прессы 2015-09-17

Keysight press release on introduction of new arbitrary waveform generator M8196A, September 2015
Keysight press release on introduction of new arbitrary waveform generator M8196A, September 2015

Материалы для прессы 2015-09-17

Keysight Technologies to Show New Test and Measurement Solutions at ECOC 2015
Keysight's new solutions are intended to enable the development of next-generation networks used for the generation and analysis of coherent optical modulated signals. These solutions will address new modulations techniques such as PAM-4, the characterization of electrical and optical transceivers, and component test.

Материалы для прессы 2015-09-15

Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication
Highly Integrated J-BERT Simplifies Testing for Next-Generation Data-Center, Long-Haul-Communication Applications

Материалы для прессы 2015-03-24

J-BERT offers adjustable and integrated inter-symbol interference
J-BERT offers adjustable and integrated inter-symbol interference

Материалы для прессы 2015-01-22

M8195A 65GSa/s AWG – Press Release
Introduces 65-GSa/s High-Speed Arbitrary Waveform Generator

Материалы для прессы 2014-09-10

Introduces Industry's Most Accurate Test Solution for USB 3.1 Receivers
Achieve accurate receiver characterization with the J-BERT high-performance BERT

Материалы для прессы 2014-07-09

Press Releases for M8000 Series
New M8000 Series of BER Test Solutions

Материалы для прессы 2014-03-18

Press Releases for M8190A

Материалы для прессы 2013-09-06

Press Release for M8192A
Infinite Playtime and Multichannel Support introduced for Arbitrary Waveform Generator

Материалы для прессы 2013-09-05

World’s First WiGig Technology Plugfest - Press Material
Ron Nersesian, President of Agilent’s Electronic Measurement Group, shares Agilent’s product contributions to support the first annual WiGig Technology Plugest with baseband, RF and mmWave signal generation and analysis capability.

Материалы для прессы 2011-10-24

Agilent Technologies Introduces First Complete and Compliant 60 GHz Wireless Test Solution
Agilent announces the first complete and compliant test solution for 60-GHz wireless devices, including WiGig, WirelessHD and IEEE 802.11ad devices.

Материалы для прессы 2011-10-10