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電子量測

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A Game Changing Approach to Embedded Board Testing Webinar
Original broadcast July 25, 2018

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Solving IoT Device Test Challenges Webinar Series
Webcast series

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半導體參數測試:返回到基礎知識
《返回到基礎知識》研討會提供執行快速脈衝 IV 量測的實用提示和技巧,以及實用的電容量測考量。

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Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

研討會講義 2016-12-21

PDF PDF 2.35 MB
DC Power supply fundamentals to get the most out of your applications
With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features.

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

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Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

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Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

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Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

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Optimise UE design for greater battery run-time
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

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全新桌上型電源量測設備提供彩色 GUI,可因應困難的元件測試挑戰
Agilent B2900A 系列電源量測設備 (SMU) 提供高速、經濟實惠的量測解決方案,可大幅縮短測試時間並降低測試成本。

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大幅延長使用電池之無線裝置的運作時間
這個網路直播影片介紹安捷倫獨有的「無間斷量測範圍」功能,如何破除傳統電池耗電量測試技術的限制。

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