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LIV Test of Laser Diode Using the B2900A Series of SMUs-Application Note
This application introduces features of B2900A Series as the best solution for LIV test of laser diode.

Application Note 2015-12-03

Diode Evaluation Using the B2900A Series of SMUs - Application Note
This application note shows how the Keysight B2900A Series Precision SMU allows you to accurately and easily measure the basic IV parameters and characteristics of diodes.

Application Note 2015-12-02

Optoelectronic IC/Component Evaluation - Application Brief
This 2-page application brief describes "Quick Bench-top Evaluation" of an optoelectronic component (optocoupler) and shows real measurement results made by B2900A series.

Application Note 2015-11-24

Wide Range of Resistance Measurement Solutions from μΩ to PΩ - Application Brief
This application brief summarizes Keysight's resistance measurement solution. The detailed information can be seen 5992-1212EN application note.

Application Note 2015-11-18

Precision Device Characterization Solution Using the B2900A Series - Application Brief
This 2-page application brief introduces the precision device characterization solution using the B2900A precision source/measure unit.

Application Note 2015-11-11

Evaluating Adaptive Fast USB Battery Charging of Mobile Devices - Application Note
To offset greater power consumption, today’s mobile devices are now incorporating larger batteries; and the consequences are it takes longer to recharge due to the marginal power delivery of USB.

Application Note 2015-09-16

Power-Consumption Measurements for LTE User Equipment - Application Note
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Testing Battery Chargers with the U2722A USB Modular Source Measure Unit - Application Note
This application note shows the capabilities and benefits of utilizing the U2722A USB modular source measure unit to test battery chargers.

Application Note 2014-07-31

PDF PDF 1.33 MB
Customizing Keysight B1500A EasyEXPERT Application Tests - Application Note
This six-page application note shows how easy it is to change the input parameter range in a furnished B1500A application test.

Application Note 2014-07-31

Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

GaN Current Collapse Effect Evaluation Using the B1505A – Application Brief
This document outlines how the B1505A with the N1267A High Voltage Source Monitor Unit/High Current Source Monitor Unit Fast Switch can be used to solve GaN current collapse measurement challenges.

Application Note 2013-09-30

MEMS Accelerometer Evaluation
This 1-pager describes "Quick Bench-top Evaluation" of a MEMS accelerometer and shows real measurement results made by B2900A series.

Application Note 2013-05-24

SMU (Source/Measure Unit) for ICs and Electronic Components
This is introductory flyer for a series of "Quick Bench-top Evaluation" flyers scheduled to be developed every month until May or June 2012. B2900 series

Application Note 2013-05-24

Choosing System DC Power Supplies to Optimize System Integration and Performance - Application Note
Your power supply choice affects the assembly, performance and longevity of your test system. Lower integration costs, faster throughput, better DUT protection, better test integrity and longer system.

Application Note 2013-04-01

Varistor Production Test Using the Keysight B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for varistor production test.

Application Note 2013-01-07

LED Production Test Using the Keysight B2911A
This technical overview describes LED production test using the B2900A series precision source/measure unit.

Application Note 2013-01-07

IV characterization of OLEDs using the Keysight B2911A
This technical overview describes IV characterization of OLED's using the B2900 series precision source/measure units.

Application Note 2013-01-07

Resistor Production Test Using the Keysight B2911A
This technical overview describes the use of the B2900 series of precision source/measure units for resistor production test.

Application Note 2013-01-07

Fast fT-Ic Measurement Using the Keysight B2912A
This technical overview describes the use of the B2900 series to make Fast fT-Ic measurements

Application Note 2013-01-07

Varistor Evaluation Using the Keysight B2900A Series
This application introduces features of B2900A Series as the best solution for accurate characterization of varistor and other two terminal devices.

Application Note 2013-01-07

Thermistor Evaluation Using the Keysight B2911A
This application introduces features of B2900A Series as the best solution for accurate characterization of thermistor and other two terminal devices.

Application Note 2013-01-07

Thermistor Production Test Using the Keysight B2911A
This technical overview shows how to use the Keysight B2900A Series Precision SMU for production thermistor test, in addition to the features that make it well-adapted for production test.

Application Note 2013-01-07

Measuring Power BJT Electrical Characteristics using the B1505A - Application Note
B1505A can measure the typical DC and capacitance parameters of power BJT devices.

Application Note 2011-08-30

PDF PDF 493 KB
Measuring Power MOSFET Electrical Characteristics using the B1505A
This application note explains how to use the B1505A to measure the typical DC and capacitance parameters of power MOSFET devices.

Application Note 2011-08-22

AN B1505A-4 Direct Power MOSFET Capacitance Measurement at 3,000 V
This application note describes direct capacitance measurement at a 3,000 V bias voltage by using the Keysight B1505A.

Application Note 2011-01-10

PDF PDF 1.14 MB

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