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IV and CV Measurement Using the Keysight B1500A MFCMU and SCUU - Application Note
This eight-page application note illustrates how an accurate IV and CV measurement system can be confugured using the B1500A MFCMU and SCUU.

Application Note 2019-10-22

Random Telegraph Noise (RTN) Measurement of Advanced MOSFET using B1500A WGFMU Module
This application note describes random telegraph noise (RTN) measurement in advanced MOSFETs using the B1500A’s WGFMU module and shows actual measurement examples.

Application Note 2019-10-18

1500 A and 10 kV IGBT Characterization by using B1505A - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters found in IGBT specifications.

Application Note 2019-10-14

B1500A: A Complete CMOS Reliability Test Solution - Application Note
This application note gives an overview of the B1500A’s key measurement features and shows how the B1500A is a complete solution for verifying CMOS process reliability.

Application Note 2019-10-14

Accurate and Efficient Characterization of Power Devices at 3000 V/20 A - Application Note
This application note describes the use of the Keysight B1505A Power Device Analyzer/Curve Tracer for accurate and efficient characterization of power devices at 3000 V/20 A.

Application Note 2019-10-12

Measuring Pulsed/Transient Electrical Properties of OTFTs - Application Note
The Keysight B1530A WGFMU modules for B1500A combines fast current/voltage measurement and AWG functions and allow user to measure pulsed / transient electrical property of OTFT without nay additional measurement instruments.

Application Note 2019-10-10

Internal Gate Resistance Measurement Using the B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2019-10-10

PDF PDF 2.60 MB
Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2019-10-10

IGBT Sense Emitter Current Measurement Using the Keysight B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2019-10-10

PDF PDF 2.25 MB
Thyristor Characterization Using the Keysight B1505A Power Device Analyzer/Curve Tracer - Applicatio
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2019-10-10

PDF PDF 1.78 MB
How to Perform QSCV (Quasi-Static Capacitance Voltage) Measurement - Application Note
This application note explains how to perform QSCV (quasi-static capacitance voltage) measurement using Keysight B1500A semiconductor device analyzer.

Application Note 2019-10-10

PDF PDF 3.39 MB
1500 A and 10 kV High-Power MOSFET Characterization using the Keysight B1505 - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters of high-power MOSFETs.

Application Note 2019-10-10

Next Generation Curve Tracer Revolutionizes Failure Analysis - Application Brief
This application note introduces curve tracer mode and windows environment of the B1505A's built-in EasyEXPERT software that will replace conventional analog curve tracers.

Application Note 2019-10-09

Ultra Low Current DC MOSFET Characterization at the Wafer Level - Application Note
This application note discusses the use of the B1500A semiconductor device analyzer for ultra low current DC MOSFET characterization at the wafer level.

Application Note 2019-10-09

Electronic Load Fundamentals - White Paper
This White Paper discusses fundamentals of an electronic load including: electronic load operation modes, e-load applications and how to select the right electronic load.

Application Note 2019-05-11

Bipolar Transistor Characterization Using the B2900A Series of SMUs - Application Note
This application note describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

Application Note 2019-03-26

How to Optimize Power Supply Testing Using the Keysight N6790 Series - Application Note
The Keysight N6790 Series electronic load modules give you unmatched performance and speed for power supply test. For bench or system applications in any testing environment, you can count on high quality and reliability with superior performance and features.

Application Note 2019-02-01

Laser Diode Characterization and Its Challenges
This white paper discusses the laser diode characterization and the challenges the test engineer faces.

Application Note 2018-10-29

Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications
Using the N6705A for bench-top test and debug of power transient issues for automotive and aerospace/defense

Application Note 2018-09-19

LIV Test of VCSEL for 3D Sensing - Application Note
This application note explains what the challenges on an LIV characterization is, how the Keysight B2900A SMU can overcome them, and show examples to make LIV measurements using the B2900A Series.

Application Note 2018-07-02

Wide Range of Resistance Measurement Solutions from µΩ to PΩ - Application Note
This application note introduces keysight's resistance measurement solution, and discuss major error factors in resistance measurements and how to eliminate those error factors.

Application Note 2018-06-06

Battery LIfe Challenges in IoT Wireless Sensors and the Implication for Test - Application Note
This application note discusses battery life challenges in IoT wireless sensors and the implications of test.

Application Note 2018-05-10

Accelerate the development of Next Generation Non-Volatile Memory - Application Brief
You can accelerate the development of next generation non voltile memory; CX3300 series for visualizing the fast switching characteristics, B1500A for basic IV,CV,pulsed IV and reliability testing.

Application Note 2018-04-09

A Source/Measurement Unit Based Teaching Lab Solution Package for MEMS Technologies
This 2-page introduces the Keysight B2902A/12A Source/Measure Unit based Teaching Lab Solution Package for MEMS Technologies.

Application Note 2018-03-15

PDF PDF 598 KB
Measuring Battery Life on Battery-Powered Medical Devices - Application Note
This application notes is to describe how to measure battery life on battery-powered medical devices, consideration for battery run-down test and burden voltage impacts towards current measurement.

Application Note 2018-03-12

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