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Pb-Free’s Impacts on Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, January 2005.

文章 2005-12-05

PDF PDF 75 KB
Selcom Evaluates Keysight 5DX and BGA Open Outlier Technology
Case study of Selcom success in detecting BGA opens using Keysight 5DX and oval pad designs

案例分析 2005-10-27

PDF PDF 319 KB
5DX Series II/2 End of Support
5DX Series II/2 end of support is June 30, 2005. This is a description of the options available to you as we reach the end of standard support life.

更新换代通知 2005-04-01

Selcom Testimonial
Customer testimonial which discusses the advantages gained from using the Keysight Medalist Family of test and inspection systems.

案例分析 2005-03-14

WMF WMF 19.21 MB
Gauge Repeatability on 5DX X-ray System
Summary of 5DX repeatability capability, factors that influence the repeatability capabilities of the 5DX, impacts to gauge repeatability and reproducibility (GR&R) results.

应用说明 2005-03-09

PDF PDF 102 KB
NT 4.0 to Microsoft® Windows® XP Professional with Service Pack 2 Upgrade Procedure
This manual describes the process of upgrading a 5DX system controller from NT to XP.

安装手册 2005-02-23

PDF PDF 514 KB
Test and Inspection as Part of the Lead-free Manufacturing Process
The paper addresses issues that will impact defect levels and defect spectrum during the transition to lead-free manufacturing. It also addresses different test and inspection systems’ readiness to test lead-free printed circuit board assemblies.

应用说明 2005-02-22

PDF PDF 421 KB
AXI Conquers Hidden Joint Defects
Written by Jeremy Jessen, Agilent Technologies. Published In SMT magazine, February 2005.

文章 2005-02-01

PDF PDF 134 KB
Testing FPGullwing Misalignment Across the Pad
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.

应用说明 2004-12-08

PDF PDF 1.58 MB
Understanding the PCAP Polarity Reject Signal
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.

应用说明 2004-12-02

PDF PDF 1.09 MB
Handling Surface Mapping with Varying Board Construction
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.

应用说明 2004-12-02

PDF PDF 1.02 MB
Understanding and Configuring the 5DX Selftest and Black/White Level Tests
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.

应用说明 2004-12-01

PDF PDF 158 KB
How and Why: Confirmation and Adjustments
This paper describes the process of and reason for periodic adjustment of a 5DX system using the confirmation and adjustment panel.

应用说明 2004-12-01

PDF PDF 636 KB
3D Techniques in SMT Test
By Malachy Rice, Ph.D, Stacy Johnson and Glen Leinbach, Agilent Technologies. Published by EE - Evaluation Engineering, February 2004.

文章 2004-09-28

Instructions for Using One Confirmation and Adjustment Panel with Multiple Systems
Readjusting the thickness table setting for one machine, using the Confirmation and Adjustment Panel, and adjustment data for a second machine, improves the portability of applications between the two machines.

应用说明 2004-08-26

The Importance of Test and Inspection When Implementing Lead-Free Manufacturing
Many papers, articles, and studies have been written about process issues, reliability issues, repair issues, and the merits of different alloys. This paper addresses the impacts on test and inspection when going lead-free.

应用说明 2004-08-20

PDF PDF 260 KB
Selcom Group Uses Integrated Test to Cut Costs and Increase Business
Selcom Group uses a combination of test technologies from Keysight to meet stringent cost, quality, and shipping targets, allowing Selcom to continue growing and thriving in a difficult worldwide economy.

案例分析 2003-10-24

PDF PDF 600 KB
Step-by-Step Series: Step 9 -Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Published in SMT, October 2003.

文章 2003-10-01

Selecting the Optimal Test Strategy
Written by Stig Oresjo, Agilent Technologies. Published in Circuits Assembly, July 2003.

文章 2003-07-01

TestWise SPC Reports AwareTest xi
TestWise SPC Reports AwareTest xi have been created to optimize use of the Keysight 5DX and 5DX Paperless Repair.

发布说明 2003-06-13

What to Consider When Selecting the Optimal Test Strategy
This paper addresses several issues for selecting the optimal inspection strategy, presenting data from many studies that Keysight has performed in the quest to find the optimal test / inspection strategy.

应用说明 2003-03-01

PDF PDF 175 KB
PLR and 5DX Customized Defect Names Implementation
You can use customized defect names on both the 5DX and on the PLR. This is particularly valuable when you want to display defect names in a local language.

应用说明 2003-03-01

AwareTest xi Case Study #3
This case study compares fault coverage of the current test strategy (automatic optical inspection/full in-circuit test) with a combined x-ray inspection/simplified in-circuit test strategy.

案例分析 2003-02-15

PDF PDF 164 KB
AwareTest xi Case Study #1
This case study compares a fully-probed in-circuit test on a conventional high node count test system with a combined x-ray/in-circuit test strategy, using the simplified in-circuit test.

案例分析 2003-02-15

PDF PDF 127 KB
AwareTest xi Case Study #2
This case study compares the current test strategy with a full combined test strategy and a simplified combined test strategy (x-ray inspection followed by simplified in-circuit test).

案例分析 2003-02-15

PDF PDF 763 KB

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