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Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

应用说明 2001-02-27

PDF PDF 575 KB
Use of Wrong Thickness Technique Gives Bad Test Results
Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Keysight 5DX, each based on use of a different Confirmation & Adjustment panel.

应用说明 2000-12-31

Using X-ray Test to Ensure Solder Joint Reliability
Written by Werner Engelmaier, Tracy Ragland and Colin Charette. Published with permission from Circuits Assembly, December 2000.

文章 2000-12-01

PDF PDF 503 KB
The Why, Where, What, How, and When of X-ray Test
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?

应用说明 2000-11-01

PDF PDF 1.30 MB
Learned Data for the 5DX
The Keysight 5DX uses learned data in several ways to improve algorithm performance. There are basically 2 different forms of learned data.

应用说明 2000-11-01

Applying X-ray: Beyond Features and Into Context
Written by Leora E. Lawton, Ph.D. Published with permission from Circuits Assembly, August 2000.

文章 2000-08-01

PDF PDF 61 KB
Complementary Test Strategies on High-Complexity Boards
Written by Amit Verma, Mark Ogden and John Kokoska, of Celestica Inc. Published with permission from Circuits Assembly, August 2000.

文章 2000-08-01

PDF PDF 92 KB
X-rays Expose Hidden Connections
Written by Brian Kerridge, Chief Editor, Test & Measurement Europe and Jon Titus, Editorial Director, Test & Measurement World. Printed with permission, August-September 2000.

文章 2000-08-01

PDF PDF 271 KB
New Test Strategy for Tomorrow's Manufacturing
Written by Mark Terry, Agilent Technologies. Published with permission from Circuits Assembly, August 2000.

文章 2000-08-01

PDF PDF 119 KB
Pursuing Perfection and Other Pipe Dreams
Written by Steve Scheiber, EP&P. Published with permission from Electronic Packaging and Production, Feb. 2000.

文章 2000-02-01

PDF PDF 618 KB
Reducing Load Time for Loaderless Systems
For Series 2L systems, it may be possible to reduce the time it takes to load a panel.

应用说明 1999-12-01

5DX Series 2L Site Preparation Manual
This document describes what needs to be done prior to the Keysight 5DX system delivery.

安装手册 1999-11-01

PDF PDF 333 KB
Tackling Advanced Technology Boards: Combining X-ray and ICT
Written by By Ed Crane, Ed Kinney and Bill Jeffrey. Printed with permission from Circuits Assembly, September 1999.

文章 1999-09-01

PDF PDF 890 KB
5DX Series 2L Installation Guide
This document is intended to guide you through the Keysight 5DX installation process.

安装手册 1998-09-01

PDF PDF 2.02 MB
NDF and RTF - Hashed Names
There have been many questions about hashed directory names. This is a brief explanation of why they are, and how they are generated.

应用说明 1998-06-30

Effects of Lead Free Solders on Imaging Characteristics of the Keysight 5DX Laminographic X-ray Test
The electronics industry is under pressure to migrate solder processes away from the usage of eutectic tin-lead solder and towards utilization of lead-free compounds.

应用说明 1998-05-01

PDF PDF 83 KB
5DX Series II Installation Guide
This document is intended to guide you through the Keysight 5DX Series installation process.

安装手册 1998-04-01

PDF PDF 1.82 MB
5DX Series II Site Preparation Manual
This document describes what needs to be done prior to the Keysight 5DX system delivery.

安装手册 1998-03-01

PDF PDF 357 KB
Use of the Test Results Command Processor
TRCMDPRO processes the results from the Keysight 5DX in a way that is specified by a command file. This file is TRCMDPRO.CMD. In addition to the software revisions named, the document applies to all 5DX software versions.

应用说明 1998-01-12

PDF PDF 20 KB

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