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AFM - 原子間力顕微鏡

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Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

アプリケーション・ノート 2017-11-08

PDF PDF 8.01 MB
5500 AFM Controller Upgrade - Data Sheet
Features of benefits of the digital controller with the 5500 AFM

データシート 2017-10-26

PDF PDF 546 KB
9500 AFM - Data Sheet
Data sheet for the 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

データシート 2017-10-26

PDF PDF 2.69 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

アプリケーション・ノート 2017-08-21

PDF PDF 598 KB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

アプリケーション・ノート 2017-08-21

PDF PDF 5.16 MB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

アプリケーション・ノート 2017-08-18

PDF PDF 4.22 MB
AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

アプリケーション・ノート 2017-06-15

PDF PDF 3.96 MB
Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

アプリケーション・ノート 2017-04-18

PDF PDF 1.80 MB
5600LS High Resolution Large Stage AFM - Data Sheet

データシート 2017-03-20

PDF PDF 4.85 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

アプリケーション・ノート 2017-03-09

PDF PDF 6.24 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

アプリケーション・ノート 2017-03-09

PDF PDF 5.29 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

アプリケーション・ノート 2017-03-09

PDF PDF 4.15 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

アプリケーション・ノート 2017-02-21

PDF PDF 1.75 MB
High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

アプリケーション・ノート 2016-12-08

PDF PDF 1.87 MB
QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

アプリケーション・ノート 2016-11-09

PDF PDF 989 KB
【電池素材評価】高周波を用いたインピーダンス分布測定による電極の均一性/劣化観察
AFM + VNAによる新しい電極の観測手法

ブローシャ 2016-10-31

PDF PDF 548 KB
In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

アプリケーション・ノート 2016-10-11

PDF PDF 1.13 MB
AFM/SPM Accessories - Brochure
Catalog of all AFM accessories and options

ブローシャ 2016-09-22

PDF PDF 4.63 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

アプリケーション・ノート 2016-08-30

PDF PDF 2.89 MB
電気物性/電気化学解析 ナノスケール素材の形状測定/特性評価ソリューション
液中/雰囲気中の形状、電界/磁界分布などを視覚化!

ブローシャ 2016-08-01

PDF PDF 532 KB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

アプリケーション・ノート 2016-07-15

PDF PDF 3.31 MB
Post Processing Pico Image Software for Keysight AFM Systems - Data Sheet
Pico Image surface imaging and analysis software is dedicated to Keysight AFMs and SPMs. It contains three levels for basic, advanced, and expert users. Standalone and network licenses are available.

データシート 2016-07-02

PDF PDF 2.89 MB
Kelvin Force Microscopy Using the 9500 AFM - Application Brief
Discussion on KFM mode using the 9500AFM and QuickScan

アプリケーション・ノート 2016-06-07

PDF PDF 1.75 MB
9500 AFM Applications in Polymer Materials - Application Note
Application note describing the use of the 9500 AFM in Polymer research

アプリケーション・ノート 2016-05-23

PDF PDF 2.16 MB
Magnetic Force Microscopy Using the 9500 AFM - Application Note
Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy mode that enables researchers to probe the magnetic properties of a material. This note explores the characterization of magnetic samples.

アプリケーション・ノート 2016-04-25

PDF PDF 2.08 MB

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