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TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2019-07-03

How to build a fixture for use with the Keysight Cover-Extend Technology
Cover-Extend Technology is Keysight’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2017-12-05

Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.

Application Note 2017-07-31

Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.

Application Note 2015-10-30

PDF PDF 6.31 MB
Implementing Cover-Extend Test on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note discusses the process of test generation on the x1149 boundary scan analyzer with Cover-Extend Technology, and suggestions on fixturing in order to successfully implement CET.

Application Note 2015-05-26

PDF PDF 1.67 MB
Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

PDF PDF 435 KB
Network Parameter Measurement: Best Practices using the Keysight Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Keysight Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

Maximising Test Coverage with Keysight Medalist VTEP v2.0
This paper describes how to get the most from Keysight Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

Application Note 2007-04-17

Implementation of Solder-bead Probing in High Volume Manufacturing
Copyright © 2006 IEEE. This material is posted here with permission of the IEEE. Reprinted from ITC International Test Conference, Paper 5.4.

Application Note 2006-10-25

PDF PDF 844 KB
Bead Probes In Practice
Copyright © 2005 IEEE. This material is posted here with permission of the IEEE. Reprinted from ITC International Test Conference, Paper 26.2.

Application Note 2006-10-24

PDF PDF 2.20 MB
Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.

Application Note 2006-10-24

Breakthrough Innovations: Keysight Automated Silicon Nails
Automated Silicon Nails takes the popular IEEE 1149.1 Boundary-Scan standard even further by using Boundary-Scan chains to automatically test non-Boundary-Scan devices.

Application Note 2001-08-15

PDF PDF 460 KB
Electrical In-circuit Test Methods for Limited-access Boards
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

Application Note 2001-02-27

PDF PDF 47 KB