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In-circuit Test > Medalist i3070 Systems

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Reducing Tester Downtime Remotely - Application Note
Improve Expert Consultant on-site response time to resolve problems on manufacturer's production test equipment.

Application Note 2019-06-18

PDF PDF 555 KB
Global EMS Manufacturer Reduces Time to Market Using PathWave Manufacturing Analytics - Case Study
The real time automated result analysis and anomaly detection in Keysight’s PathWave Manufacturing Analytics reduce engineering time and effort significantly, empowering the EMS company to release the product into the market sooner.

Case Study 2019-06-04

PDF PDF 2.09 MB
Quadruples throughput with i3070 4-Module In-Circuit Inline in Automotive Electronics Manufacturing
An Automotive Electronics Manufacturing increases the test throughput more than 50% by using i3070 4-Module Inline In-Circuit System with Dual Board Staging and Throughput Multiplier feature.

Case Study 2019-05-22

PDF PDF 4.96 MB
ICT System Support Delivery Options
Support delivery guidelines for Keysight In-circuit Test Systems.

Technical Overview 2019-04-16

PDF PDF 272 KB
Keysight System Uptime Support Product Guide
This data sheet describes the level of support provided under each support product number for Keysight's range of support products for in-circuit test, imaging inspection and functional test systems.

Data Sheet 2019-02-20

PDF PDF 1017 KB
How to test Polarity of Electrolytic Capacitor on i3070 In-Circuit Tester? - Application Note
i3070,Polarity Test,Electrolytic Capacitor,In-circuit Tester,E9901E,E9902E,E9903E,E9905E,E9905EL,E9988E,E9988EL,E9986E,5992-3651EN

Application Note 2019-02-11

PDF PDF 832 KB
Test Orientation of Polarized Capacitor in i3070 ICT Test Platform - Application Note
Reversing the voltage on the polarized capacitor could be hazardous, resulting in explosion or fire. It is crucial to detect wrongly oriented polarized capacitor and get it fixed as early as possible.

Application Note 2019-01-03

PDF PDF 310 KB
i3070 Series 5i Inline In-Circuit Test System – Data Sheet
Keysight’s i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

Data Sheet 2018-06-12

Head-to-Head Comparison - Vectorless Test: NanoVTEP vs VTEP - Case Study
This case study summarizes some of the results of early tests conducted at customer sites, and includes results of controlled tests conducted in Keysight’s R&D lab.

Case Study 2018-06-05

PDF PDF 3.39 MB
Integrate Collaborative Robot (Cobot) with i3070 ICT Test Platform - Application Note
Improve quality and efficiency of daily works on production line and reduce dependency on human operators by integrating Cobot (collaborative robot) with i3070 ICT test platform.

Application Note 2018-05-15

PDF PDF 3.18 MB
How to build a fixture for use with the Keysight Cover-Extend Technology
Cover-Extend Technology is Keysight’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2017-12-05

Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2017-12-02

PDF PDF 1.89 MB
Test Coverage Consultant - Data Sheet
The Keysight Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Keysight Test Coverage Consultant Keysight Medalist i3070 Series 5

Data Sheet 2017-12-01

Vectorless Test EP (VTEP) Goes Head-to-Head with Keysight TestJet - Case Study
VTEP has proven its abilities to improve in-circuit test coverage by over 80 percent compared to the older TestJet technology, especially on boards with hard-to-test packages such as BGAs, micro-BGAs, and SMT edge connectors.

Case Study 2017-12-01

PDF PDF 1.64 MB
x1149 Boundary Scan Solution for Blade Server Board - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-12-01

PDF PDF 6.16 MB
Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Keysight Test Coverage Consultant up and running on your PC quickly.

Technical Overview 2017-12-01

Limited Parts Agreement
Keysight understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

Brochure 2017-12-01

PDF PDF 552 KB
The Keysight Panel Test and Throughput Multiplier Advantage - Technical Overview
Many have tried to emulate the Keysight Panel Test and Throughput Multiplier capabilities, yet our advantage remains in providing matchless high throughput and low total cost of ownership.

Technical Overview 2017-07-13

PDF PDF 1.17 MB
i3070 Inline ICT Improves Functional Test Yield of SSDs - Case Study
Find out how one customer reported first pass yield results of more than 95% with less than 0.5% false failures, after installing the i3070 Series 5 Inline ICT systems.

Case Study 2017-07-10

PDF PDF 610 KB
Medalist i3070 Test Throughput Optimization - Application Note
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2017-06-16

Preserve your i3070 investment with our suite of Keysight i3070 Upgrade Support Agreements - Flyer
This one-pager contains an overview of Keysight i3070 Upgrade Support Agreements to better preserve your investment and enhance test capabilities on your i3070.

Brochure 2017-06-05

PDF PDF 261 KB
i3070 In-Circuit Test System Onsite Agreement - Data Sheet
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

Data Sheet 2017-03-22

PDF PDF 728 KB
Understanding x1149 Integrity Test - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-02-16

PDF PDF 2.48 MB
i3070 Log Record Format
The i3070 is an in-circuit test system that outputs text log files for each board tested. This document describes the format and syntax of these log record files in order to understand how to read the files.

Help File 2017-02-10

PDF PDF 250 KB
Rehost Service for Keysight ICT, AXI and AOI systems
Rehost service is included as part of Keysight support agreement for hardware support or software subscription service.

Feature Story 2016-11-10

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