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Friction, Phase and KFM Characterization of Functionalized Graphene Oxide

Application Note 2012-08-09

PDF PDF 443 KB
Quasistatic and Continuous Dynamic Mechanical Behavior of Bicomponent Fibers
Study of the mechanical behavior of polymer fibers

Application Note 2012-07-13

PDF PDF 310 KB
Mapping the Mechanical Properties of Alloyed Magnesium (AZ 61) - Application Note
Overview of using Express Test on the G200 nanoindenter to determine the properties of individual phases within a popular magnesium alloy, AZ 61.

Application Note 2012-07-13

PDF PDF 155 KB
Graphene Oxide & Its Applications Revealed by Atomic Force Microscopy

Application Note 2012-06-27

PDF PDF 305 KB
Low Voltage Scanning Electron Microscopy: Promises and Challenges - Application Note

Application Note 2012-06-13

PDF PDF 302 KB
Rapid Mechanical Characterization of Low-Dielectric-Constant Films - Application Note
This application note demonstrates the cumulative benefit of CSM and Express Test for Nanoindentation testing for in the semiconductor industry.

Application Note 2012-06-12

PDF PDF 448 KB
Mapping the Mechanical Properties - Application Note
Overview of Mapping mechanical properties of 2205 Duplex Stainless Stell Using the NEW Express Test.

Application Note 2012-04-23

PDF PDF 1.99 MB
Quantitative Surface Potential Measurement Using KFM - Application Note

Application Note 2012-04-20

PDF PDF 360 KB
Rapid Mechanical Characterization of Fiberglass via Express Test - Application Note
Overview of Express Test on G200 used to perform an array of 40x40 indents in order to map the hardness and elastic modulus of a sectioned fiberglass computer board over a 40µm x 40µm area. The 1600 indents were completed in less than 26 minutes.

Application Note 2012-04-02

PDF PDF 529 KB
Determination of Critical Tearing Energy of Polymer Films - Application Note
Overview of critical tearing energy for two commercially available polymer tapes that are measured from trouser-tear tests. The capability of measuring small loads, along with the high force resolution, enabled us to capture the variations in force during tearing of thin polymer films

Application Note 2012-03-22

PDF PDF 167 KB
Tensile Stress-Strain Response of Small Diameter Electrospun Fibers
Overview of characterization of tensile stress-strain behavior of small diameter electrospun fibers of PCL using the Keysight UTM T150

Application Note 2012-03-20

PDF PDF 211 KB
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene
Thickness-dependent Electrical Properties of Single-layer Graphene and Few-layer Graphene: a Kelvin Force Microscopy Study

Application Note 2012-03-13

FE-SEM Image Library

Demo 2012-01-11

AFM Image Library

Demo 2012-01-11

AFM Bibliography

Demo 2012-01-11

Nanoindenter Bibliography

Demo 2012-01-11

Quasi-static and Dynamic Compression Behavior of Flexible Cellular Materials - Application Note
Study of mechcnical properties of lightweight cellular materials

Application Note 2012-01-04

PDF PDF 345 KB
Investigating Highly Dopant Marker Layers in GaN on Sapphire Using SMM - Application Note

Application Note 2012-01-03

PDF PDF 671 KB
Complex shear modulus of commercial gelatin by instrumented indentation
Study of mechanical similarity beween gels & biological tissue

Application Note 2011-12-30

PDF PDF 115 KB
Scripting Interface for Enhanced Control of Keysight AFM Systems - Data Sheet
Keysight PicoScript is an optional scripting interface package that greatly enhances the capabilities of Keysight PicoView, the imaging and analysis software that controls all Keysight AFM systems.

Data Sheet 2011-12-01

PDF PDF 116 KB
Tensile Testing of Copper Fibers in Conformance with ASTM C1557 Using a Keysight UTM 150
Tensile test of copper fibers that prove Thst the T150 UTM meets ASTM standards

Application Note 2011-11-15

PDF PDF 191 KB
The Role of Compact Low Voltage FE-SEM in the Analysis of AFM Cantilevers - Application Note
Application Note on the study of AFM cantilivers using the 8500B FE-SEM

Application Note 2011-11-02

PDF PDF 2.50 MB
Strain Rate of Sensivity (SRS) of Nickel by Instrumented Indentation - Application Note
Explanation of new method for strain sensivity rate of very hard materials

Application Note 2011-10-28

PDF PDF 304 KB
EC-AFM: Engineered for Electrochemistry - Data Sheet

Data Sheet 2011-10-06

PDF PDF 411 KB
The Role of a Compact Low Voltage FE-SEM in Semiconductor Failure Analysis

Application Note 2011-10-04

PDF PDF 415 KB

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