您可能感興趣的網頁。 觀看搜尋結果:

 

聯絡是德專家

技術支援

原子力顯微鏡、FE-SEM、頻譜放射遮罩、UTM

依產品型號搜尋可用的支援:

縮小範圍

依內容類型

1-25 / 144

排序:
AFM-Based Characterization of Electric Properties of Soft Materials - Application Note
Local electric and dielectric properties of materials in a broad frequency range (up to several GHz) and effects of vapor condensation have been studied with environmental AFM in this note.

應用手冊 2018-03-09

PDF PDF 3.12 MB
[Battery Material Evaluation] Impedance Distribution Measurement Using High Frequencies Enables Obse

型錄 2018-01-16

PDF PDF 448 KB
Studying Thermal Transitions of Materials Using Quick Scan Technology in Atomic Force Microscopy

應用手冊 2017-12-22

PDF PDF 5.03 MB
Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.

應用手冊 2017-11-21

PDF PDF 2.10 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

應用手冊 2017-11-08

PDF PDF 8.01 MB
5500 AFM Controller Upgrade - Data Sheet
Features of benefits of the digital controller with the 5500 AFM

產品型錄 2017-10-26

PDF PDF 546 KB
9500 AFM - Data Sheet
Data sheet for the 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

產品型錄 2017-10-26

PDF PDF 2.69 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

應用手冊 2017-08-21

PDF PDF 598 KB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

應用手冊 2017-08-21

PDF PDF 5.16 MB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

應用手冊 2017-08-18

PDF PDF 4.22 MB
AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

應用手冊 2017-06-15

PDF PDF 3.96 MB
Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

應用手冊 2017-04-18

PDF PDF 1.80 MB
5500 Atomic Force Microscope (AFM) - Data Sheet
Data sheet for the 5500 AFM/SPM Microscope with features & benefits and options

產品型錄 2017-03-29

5600LS High Resolution Large Stage AFM - Data Sheet

產品型錄 2017-03-20

PDF PDF 4.85 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

應用手冊 2017-03-09

PDF PDF 4.15 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

應用手冊 2017-03-09

PDF PDF 5.29 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

應用手冊 2017-03-09

PDF PDF 6.24 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

應用手冊 2017-02-21

PDF PDF 1.75 MB
High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

應用手冊 2016-12-08

PDF PDF 1.87 MB
QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

應用手冊 2016-11-09

PDF PDF 989 KB
In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

應用手冊 2016-10-11

PDF PDF 1.13 MB
AFM/SPM Accessories - Brochure
Catalog of all AFM accessories and options

型錄 2016-09-22

PDF PDF 4.63 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

應用手冊 2016-08-30

PDF PDF 2.89 MB
表面觀察用於半導體晶圓/晶粒、光阻、聚合物表面觀察的奈米級解決方案
是德科技獨家開發了全新的微型靜電束柱(electrostatic beam column),包括 FE 電子源和靜電透鏡。它的大小只有 85(寬)× 38(高)公釐,而傳統靜電束柱的高度則高達 500 - 800 公釐。請即親自體驗全球首見輕巧、不佔空間的桌上型 FE-SEM。

型錄 2016-07-26

PDF PDF 6.85 MB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

應用手冊 2016-07-15

PDF PDF 3.31 MB

1 2 3 4 5 6 下一頁