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AFM-Based Characterization of Electric Properties of Soft Materials - Application Note
Local electric and dielectric properties of materials in a broad frequency range (up to several GHz) and effects of vapor condensation have been studied with environmental AFM in this note.

어플리케이션 노트 2018-03-09

PDF PDF 3.12 MB
Studying Thermal Transitions of Materials Using Quick Scan Technology in Atomic Force Microscopy

어플리케이션 노트 2017-12-22

PDF PDF 5.03 MB
Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.

어플리케이션 노트 2017-11-21

PDF PDF 2.10 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

어플리케이션 노트 2017-11-08

PDF PDF 8.01 MB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

어플리케이션 노트 2017-08-21

PDF PDF 5.16 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

어플리케이션 노트 2017-08-21

PDF PDF 598 KB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

어플리케이션 노트 2017-08-18

PDF PDF 4.22 MB
AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

어플리케이션 노트 2017-06-15

PDF PDF 3.96 MB
Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

어플리케이션 노트 2017-04-18

PDF PDF 1.80 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

어플리케이션 노트 2017-03-09

PDF PDF 4.15 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

어플리케이션 노트 2017-03-09

PDF PDF 6.24 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

어플리케이션 노트 2017-03-09

PDF PDF 5.29 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

어플리케이션 노트 2017-02-21

PDF PDF 1.75 MB
High Resolution Imaging with Keysight 9500 AFM - Application Note
This application note demonstrates that the Keysight 9500 AFM is capable of very high-resolution imaging.

어플리케이션 노트 2016-12-08

PDF PDF 1.87 MB
QuickScan Imaging of in situ Dynamical Processes Using Keysight 9500 AFM - Application Note
This application describes Quick Scan on the 9500 AFM and includes examples showing the application of the technology for capturing in situ dynamical processes.

어플리케이션 노트 2016-11-09

PDF PDF 989 KB
In situ Electrochemical Measurement Using 9500 AFM - Application Note
Electrochemical SPM has been applied to study a wide range of systems ranging from surface adsorption, film growth & dissolution, membrane transport, battery, fuel cell & photovoltaic using the 9500

어플리케이션 노트 2016-10-11

PDF PDF 1.13 MB
Scanning Microwave Microscopy for Quantitative Imaging of Biological Samples Including Live Cells
The use of Scanning Microwave Microscopy with AFM for quantitative imaging of biological samples including live cell imaging.

어플리케이션 노트 2016-08-30

PDF PDF 2.89 MB
Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

어플리케이션 노트 2016-07-15

PDF PDF 3.31 MB
A Simple Software Solution for Porosity Analysis of Shale Specimens - Application Note
High throughput shale analysis procedure including high resolution imaging of ion milled shale samples using a compact field emission SEM and a quick software analysis for 2D porosity measurement.

어플리케이션 노트 2016-07-13

PDF PDF 1.64 MB
Kelvin Force Microscopy Using the 9500 AFM - Application Brief
Discussion on KFM mode using the 9500AFM and QuickScan

어플리케이션 노트 2016-06-07

PDF PDF 1.75 MB
9500 AFM Applications in Polymer Materials - Application Note
Application note describing the use of the 9500 AFM in Polymer research

어플리케이션 노트 2016-05-23

PDF PDF 2.16 MB
Magnetic Force Microscopy Using the 9500 AFM - Application Note
Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy mode that enables researchers to probe the magnetic properties of a material. This note explores the characterization of magnetic samples.

어플리케이션 노트 2016-04-25

PDF PDF 2.08 MB
Using Nanomeasurement Systems for Nanoscale Investigations of Graphene - Application Note

어플리케이션 노트 2016-03-11

PDF PDF 7.96 MB
Using a Compact Low Voltage FE-SEM in Evaluating Materials Nano-Porosity - Application Note

어플리케이션 노트 2015-04-10

PDF PDF 2.99 MB
Why Magnification is Irrelevant in Modern Scanning Electron Microscopes - Application Note
A detailed explanation on the relative importance of magnification in Field Emission Scanning Electron Microscopy

어플리케이션 노트 2015-04-10

PDF PDF 2.90 MB

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