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E4982A LCR Meter 1 MHz to 3 GHz Migration Guide from 4287A - Application Note
This migration guide describes the difference between the Keysight E4982A LCR Meter and 4287A RF LCR Meter.

어플리케이션 노트 2019-09-19

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Impedance Analyzers and Network Analyzers - Application Note
This application note describes the benefits of using USB and LAN interfaces compared to GPIB. The target instruments are bench-top network analyzers, impedance analyzers and LCR meters.

어플리케이션 노트 2018-01-18

Characterizing Coils in Wireless Charging Systems Using the E4980A/AL LCR Meter - Application Note
This note describes how Keysight E4980A/AL Precision LCR meters are suitable for characterizing the coils which is the most commonly used component in the wireless charging system.

어플리케이션 노트 2016-12-06

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

어플리케이션 노트 2016-06-12

MEMS On-wafer Evaluation in Mass Production - Application Note
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

어플리케이션 노트 2015-08-27

Measurement of Capacitance Characteristics of Liquid Crystal Cell - Application Note
This short application note describes how to take best advantage of the 4284A's powerful features when measuring capacitance while varying an AC signal voltage applied tothe liquid crystal material under test.

어플리케이션 노트 2015-06-22

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

어플리케이션 노트 2012-10-30

임피던스 측정 핸드북

어플리케이션 노트 2012-07-06

Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.

어플리케이션 노트 2009-10-28

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

어플리케이션 노트 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

어플리케이션 노트 2008-11-21

High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

어플리케이션 노트 2008-08-21

MEMS/NEMS 디바이스 측정 솔루션
키사이트는 MEMS/NEMS 디바이스의 특성 분석을 도와 줍니다.

어플리케이션 노트 2008-06-04

Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

어플리케이션 노트 2007-04-13

Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

어플리케이션 노트 2007-04-12

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

어플리케이션 노트 2007-04-04

Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

어플리케이션 노트 2007-04-04

Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

어플리케이션 노트 2006-06-26

High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Keysight 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.

어플리케이션 노트 2001-10-25

8 Hints For Successful Impedance Measurement (AN 346-4)
Selection criteria, device characteristics, fixturing and error correction etc.

어플리케이션 노트 2000-06-01

Effective Impedance Measurement Using OPEN/SHORT/LOAD Correction
This application note describes how to make an accurate impedance measurement by using OPEN/SHORT/LOAD correction.

어플리케이션 노트 1998-06-01

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