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E4982A LCR Meter 1 MHz to 3 GHz Migration Guide from 4287A - Application Note
This migration guide describes the difference between the Keysight E4982A LCR Meter and 4287A RF LCR Meter.

应用说明 2019-09-19

PDF PDF 1.64 MB
Impedance Analyzers and Network Analyzers - Application Note
This application note describes the benefits of using USB and LAN interfaces compared to GPIB. The target instruments are bench-top network analyzers, impedance analyzers and LCR meters.

应用说明 2018-01-18

是德科技 使用 LCR 表和阻抗分析仪测量介电常数和 导磁率的解决方案
是德科技 使用 LCR 表和阻抗分析仪测量介电常数和 导磁率的解决方案

应用说明 2017-11-26

是德科技用 Keysight E4980A/AL 精密 LCR 表测试无线充电系统中的线圈
是德科技用 Keysight E4980A/AL 精密 LCR 表测试无线充电系统中的线圈

应用说明 2017-11-23

Impedance Measurement Handbook - 6th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

应用说明 2016-11-02

MEMS On-wafer Evaluation in Mass Production - Application Note
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

应用说明 2015-08-27

Measurement of Capacitance Characteristics of Liquid Crystal Cell - Application Note
This short application note describes how to take best advantage of the 4284A's powerful features when measuring capacitance while varying an AC signal voltage applied tothe liquid crystal material under test.

应用说明 2015-06-22

Impedance and Network Analysis Application List Application Note
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

应用说明 2012-10-30

是德成功测量阻抗的 8 点提示 应用指南 346-4
是德成功测量阻抗的 8 点提示 应用指南 346-4。测量阻抗有几种不同的技术和方法,应该根据测量的频率范围、要测量的阻抗参数以及想要显示的测量结果来选择一个具体的测试技术。

应用说明 2011-12-31

MEMS/NEMS Device Measurement Solution
Keysight helps you characterize MEMS/NEMS device.

应用说明 2010-09-19

Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.

应用说明 2009-10-28

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

应用说明 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

应用说明 2008-11-21

High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

应用说明 2008-08-21

Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

应用说明 2007-04-13

Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

应用说明 2007-04-12

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

应用说明 2007-04-04

Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

应用说明 2007-04-04

Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

应用说明 2006-06-26

阻抗,LCR和电阻测量仪器
阻抗,LCR和电阻测量仪器

应用说明 2004-02-20

pdf pdf 1.14 KB
阻抗,LCR和电阻测量仪器
阻抗,LCR和电阻测量仪器

应用说明 2004-02-20

pdf pdf 1.14 KB
High Accuracy and Fast RF Inductor Testing (AN 369-10)
This Application Note describes solutions offered by the Keysight 4285A Precision LCR Meter for realizing these requirements. Information for accurate and fast RF inductor testing, and for practical simple test systems are discussed.

应用说明 2001-10-25

Effective Impedance Measurement Using OPEN/SHORT/LOAD Correction
This application note describes how to make an accurate impedance measurement by using OPEN/SHORT/LOAD correction.

应用说明 1998-06-01

PDF PDF 302 KB