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Fundamentals of IV Measurements Webcast
Original broadcast February 8, 2017

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Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Материалы семинаров 2016-12-21

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Accuracy matters: Calibration Options for Lab Standards Webcast
Original broadcast May 19, 2016

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Non-destructive testing of powders, ceramic, oils, & other composite materials
Original broadcast December 11, 2014

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Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

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Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

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Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

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Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

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Modern Remote and Wireless Test Setup and Considerations
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

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Wide Bandgap (GaN & SiC) Power Semiconductor Device Measurements
Learn how to make real time IV measurements on Power Devices at upto 1.5kA and upto 10kV. The Webcast also includes GaN current collapse measurements which are essential for device development and manufacturing process optimisation.

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Measuring Complex Materials and their Components Seminar 2013
Keysight will provide a FREE all day seminar including impedance measurements fundamentals, characterizing complex materials, measuring material properties in nano-scale resolutionand discuss emerging novel materials research-challenges and solutions.

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1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices.
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

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1500A & 10kV Device Measurement Solutions for Advanced Semiconductor Power Devices
New Power Device Measurement Solutions (1500 A / 10 kV) for advanced Semiconductor Power Devices.

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