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Improving Reliability of Semiconductor Devices - Case Study
Automation of random telegraph noise measurement (RTN) is now possible using the B1500A's waveform generator/fast measurement unit (WGFMU) module and WaferPro Express.

Étude de cas 2019-09-13

PDF PDF 2.49 MB
Practical, Efficient and Safe Power Device Thermal Characterization with B1506A - Article Reprint
The B1506A has standard solution for power device thermal test and offers fast and safe solution to customers. This white paper reports the actual implementation of thermal test with B1506A.

Article 2016-03-18

PDF PDF 616 KB
Success Story at a major sewing machine company - Case Study
The case study shows how the B1505A power device analyzer/curve tracer is used to make sure of reliable product development and production at JUKI Corporation

Étude de cas 2013-09-05

PDF PDF 180 KB