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Agilent to Demonstrate Newest Test Solutions for MW, RF, Wireless, Radar at European Microwave Week
Agilent announces that it will show its newest test and measurement solutions in microwave, RF, wireless and radar for telecommunications, transportation and medical markets at European Microwave Week.

Press Materials 2011-09-27

IHP Expands its SiGe Process Design Kit Offerings for Use with ADS 2011 Software Release
Innovations for High Performance Microelectronics (IHP) announces the availability of leading-edge ADS PDKs for its 0.25 μm SiGe process (SG25H3) and 0.13 μm SiGe process (SG13S).

Press Materials 2011-09-20

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Agilent Technologies Introduces Wideband DPD Modeling Platform for LTE-Advanced, 802.11ac
Agilent announces the newest release of its W1716 DPD software, designed to enable the high levels of wireless performance necessary for emerging wideband standards such as LTE-Advanced and IEEE 802.11ac.

Press Materials 2011-08-31

Fidus Systems Offers Customers Industry-leading RF Product Development and Signal Integrity
Utilizing Agilent Technologies' Advanced Design System further strengthens Fidus' extensive RF design and tool set

Press Materials 2011-08-25

Agilent Technologies Advances X-Parameters Innovations
Agilent announces the latest wave of X-parameter innovations designed to further advance their use and support the industry's rapidly increasing interest in the technology.

Press Materials 2011-06-08

OMMIC Design Kits Offer Complete Front-to-Back Flow Support for ADS 2011
OMMIC announces the availability of their process design kits (PDKs) for use with Advanced Design System (ADS) 2011 EDA software.

Press Materials 2011-06-08

Agilent Technologies' Latest 3-D EM Simulation Platform Provides New Solver, Speed Improvements
Agilent announces the release of Electromagnetic Professional (EMPro) 2011.07, an electromagnetic modeling and simulation platform that creates 3-D models and analyzes the electrical performance of packages, connectors, antennas and other RF components.

Press Materials 2011-06-07

IBM Adds Design Kits for Agilent EDA Software to Speed RF Simulations
IBM announces process design kits (PDKs) for its RF CMOS, RF SOI and SiGe BiCMOS Specialty Foundry technologies, developed for use with ADS 2011.

Press Materials 2011-06-06

Agilent Delivers Solutions for TSMC’s 60-GHz CMOS Wireless Reference Design Kit in TSMC 65nm Process
Agilent announces the inclusion of its SystemVue, GoldenGate and Momentum RFIC solutions in TSMC’s 65-nm, 60-GHz RF Reference Design Kit, version 3.0.

Press Materials 2011-06-02

WIN Semiconductors and Agilent Technologies Significantly Expand Design Kit Offering using ADS 2011
WIN Semiconductors today announced the availability of over a dozen process design kits (PDKs) for their popular process technologies that were developed for use with Agilent Technologies’ recently released Advanced Design System (ADS) 2011 EDA software.

Press Materials 2011-05-23

TriQuint Semiconductor, Agilent Technologies Collaborate on Next-Generation Wireless Design Flow
Work Leads to Enhanced PDKs, Integrated RFIC/MMIC and RF Module Design Flows and Development of RF Module PDK

Press Materials 2011-05-18

Agilent Technologies Ships Latest IC-CAP Platform for DC and RF Device Characterization and Modeling
Software improves modeling flow with link between measurement and extraction

Press Materials 2011-05-10

Agilent Technologies’ SystemVue Smashes Validation Barriers for Emerging Wireless Circuit Designs
Agilent announces the release of SystemVue 2011.03, a leading system-level communications design environment.

Press Materials 2011-04-28

Agilent Ships Latest Advanced Design System Platform for RF and Microwave Design and Simulation
Agilent announces shipment of the latest release of its flagship RF and microwave design and simulation platform, Advanced Design System 2011.

Press Materials 2011-03-30

Agilent Extends Wireless Leadership with First-To-Market Support for 802.11ac Design and Analysis
Agilent Technologies announces that its 89600B vector signal analysis software is now able to test 802.11ac signals. This is the first dedicated 802.11ac signal analysis solution on the market.

Press Materials 2011-03-17

Agilent's Latest GoldenGate RFIC Simulation Software Raises the Bar on Performance and Usability
Agilent Technologies announces GoldenGate 2011

Press Materials 2011-03-10

Agilent Technologies' Advanced Design System 2011 EDA Platform to Debut via YouTube and Webcast
ADS 2011 debuts on YouTube and Webcast.

Press Materials 2011-02-22

Agilent Announces Electromagnetic Professional (EMPro) 2011.02
Agilent Technologies’ Latest 3-D EM Simulation Platform Provides Faster, More Accurate Modeling of RF, High-Speed Components

Press Materials 2011-02-16

Agilent to Demonstrate Industry-First Solutions for 3G/4G and LTE-Advanced at Mobile World Congress
Agilent Technologies to Demonstrate Industry-First Design and Test Solutions for 3G/4G and LTE-Advanced at Mobile World Congress

Press Materials 2011-02-07

Agilent Introduces PI Solution to Solve Key Challenge in Designing Power Distribution Networks
A power integrity solution to quickly and accurately solve the perforated-plane power integrity challenge

Press Materials 2011-02-01

Agilent Technologies Introduces Industry’s First Design and Test Solution for 3GPP LTE-Advanced
Agilent announces the first commercially available 4G system design library for 3GPP Release 10 - the W1918 LTE-Advanced Library for SystemVue.

Press Materials 2011-01-05

Agilent Technologies to Showcase Custom OFDM Waveform Design at 2010 Wireless Innovation Forum
Agilent Technologies will demonstrate the latest design and test innovations for software-defined radio (SDR) at the 2010 Wireless Innovation Forum, Dec.1-2, in Washington, D.C.

Press Materials 2010-12-01

Agilent Technologies Begins Unveiling ADS 2011 for Multi-Technology
Agilent Technologies Inc. announces the highly anticipated next release of its Advanced Design System (ADS) flagship RF design software.

Press Materials 2010-09-22

Agilent Introduces IC-CAP WaferPro Software for Automating Complex Device Modeling Applications
IC-CAP WaferPro provides a multi-site, multi-wafer, automated DC and RF measurement solution for semiconductor device modeling applications.

Press Materials 2010-08-19

Agilent Offers Industry's First Automatic IBIS-AMI Model Generation Capability in an ESL Design Flow

Press Materials 2010-06-14

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