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Network Parameter Measurement: Best Practices using the Keysight Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Keysight Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Notes d’application 2009-04-02

Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Notes d’application 2008-08-26

The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

Notes d’application 2007-10-31

Tips for X-ray Users On Exporting NDF’s With No Loads Set To False
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.

Notes d’application 2007-10-18

X-ray Test Users Utilize BOM Explorer to Change
Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested".

Notes d’application 2007-10-12

Making the Most of Keysight Throughput Multiplier on Medalist In-Circuit Test Systems
Keysight Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.

Notes d’application 2007-10-12

Medalist SP50 User Tips for Nominal Paste Factor Field
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.

Notes d’application 2007-10-11

PNA - Antenna/RCS - Reduce Measurement Test Times
This white paper describes new technology features applicable to antenna/RCS measurements, configuration diagrams, typical antenna/RCS measurement scenarios, and measurement time comparisons.

Notes d’application 2004-12-20

Magneto-Optical Disk Drive Research (PN 3) - Application Note
This 4-page Product Note describes how the Keysight 81100 family of pulse/pattern generators can be used together with a Keysight Infinium oscilloscope to help magneto-optical disk drive.

Notes d’application 2004-07-29

A New Gated-CW Radar Implementation
Review a gated-CW solution that provides performance and speed improvements for RCS measurements. Reprinted with the permission of Orbit/FR Inc.

Notes d’application 2004-03-03

Cheetah PNA RCS and Antenna Measurement System
Introducing a radar measurement system based on Keysight's PNA network analyzer. Reprinted with permission of SPC Corp.

Notes d’application 2004-03-03

PNA - Antenna - Pulsed Measurements
This paper presents advances in the instrumentation techniques that can be used for the measurement and characterization of antennas that are to be tested in a pulsed mode of operation.

Notes d’application 2004-01-06

Triggering PNA Microwave Network Analyzers for Antenna Measurements – Application Note

Notes d’application 2003-05-28

Performing Two-Tone Measurements with the Keysight 8360 (PN 8360-4)
This Product Note illustrates how to use two Keysight 8360 synthesized sweepers to obtain two tracking signals offset by a fixed frequency (fixed offset).

Notes d’application 2001-01-11

Simplified Motor Spin-up Analysis (AN 1200-1)
This Application Brief offers the Keysight 53310A Modulation Domain Analyzer as a solution to the problem of characterizing a motor's performance without the need for external controller.

Notes d’application 2000-08-01

Direct Characterization of Motion Control Systems (AN 1200-2)
This Application Brief is one of a series. It demonstrates how the Keysight 53310A makes it easy to capture and view velocity profiles, without the need for an external controller.

Notes d’application 2000-08-01

Bearing Runout Measurements (AN 243-7)
This Application Note introduces the challenge of making runout measurements in disk drives, which is a critical step in increasing storage capacity. It explains the test setup required and shows measurements of repeatable and non-repeatable runout, synchronous and asynchronous runout, and...

Notes d’application 2000-05-01

Fundamentals of Modal Testing (AN 243-3)
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Notes d’application 2000-05-01

Effective Machinery Measurements Using Dynamic Signal Analyzers (AN 243-1)
This Application Note outlines the benefits of vibration analysis and provides basic information on making machinery measurements. It explains how vibration is converted to electrical signals and how the frequency domain helps users identify the comp. of signal. It also identifies the vibration...

Notes d’application 1997-12-01

Electronic Heater Valves Testing (AN 1270-4)
Production testing of heater/air conditioning system valves is performed on high speed HP automatic test systems with minimum operator interface. This Application Note describes a typical HP VXI system configuration for testing automotive heater/air-conditioning system valves.

Notes d’application 1995-06-01

Fundamentals of the z-Domain and Mixed Analog/Digital Measurements (AN 243-4)
This Application Note is for information only. Keysight no longer sells or supports these products.

Notes d’application 1989-08-01

Measuring Switching Power Supply Stability with the HP 3562A (AN 243-2)
This Application Note is for information only. Keysight no longer sells or supports these products.

Notes d’application 1987-02-01


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