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N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

데이터시트 2018-10-02

PDF PDF 3.82 MB
x1149 Boundary Scan Analyzer - Data Sheet
The Keysight x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

데이터시트 2018-02-20

Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

기술 개요 2017-12-01

PDF PDF 550 KB
i3070 High Node Count Test Solution - Technical Overview
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

기술 개요 2015-02-12

PDF PDF 645 KB
송신/수신 모듈 테스트 플랫폼(TRM-X) - 기술 개요 (영어)
언제 어디서든 필요할 때 TRM-X 테스트 플랫폼, 측정 과학 전문성과 시스템은 AESA 레이다, 데이터 링크 및 satcom 송신/수신 모듈을 구현하기 위해 필요한 기능을 제공합니다.

기술 개요 2015-01-10

i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

기술 개요 2014-11-11

PDF PDF 213 KB