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Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504)

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505)

Application Note 2004-10-22

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506)

Application Note 2004-10-22

Side-by-Side Comparison: Keysight N5700 System DC Source and Sorensen DLM Power Supply (AN 1502-1)

Application Note 2004-10-05

PDF PDF 580 KB
How to capture, save, and reproduce arbitrary waveforms
This 6-page application note provides techniques for capturing, saving and reproducing current waveforms and profiles.

Application Note 2003-11-21

Modern Connectivity Application Note
This application note compares cost, ease of set-up, data transfer rates, and many other differences of the I/O connectivity products -- GPIB, USB/GPIB and LAN/GPIB. The reader will learn the advantage of upgrading GPIB based test systems...

Application Note 2003-10-08

66000 Modular Power System Product Note
This 50-page product note provides information on how you can get the most from the advanced programmable features of the Keysight 66000 MPS to address a variety of applications.

Application Note 2003-04-28

PDF PDF 280 KB
Designing and Testing cdma2000 Mobile Stations - Application Note 1358
One of the proposals for the IMT-2000 requirements for a 3G global wireless communications system is cdma2000. This application note describes mobile station design and measurement issues at the physical layer (layer 1) that may be different between cdma2000 and cdmaOne.

Application Note 2003-01-13

Evaluating Battery Run-down Performance of Mobile Wireless Devices
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

Application Note 2002-11-04

Using Battery Drain Analysis to Improve Mobile-Device Operating Time
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life.

Application Note 2002-09-19

Optimizing Bluetooth Device Battery Drain Measurements in Manufacturing (AN 1396)
This application note discusses optimizing battery drain measurements in manufacturing test for Bluetooth devices.

Application Note 2002-04-03

Battery Testing (AN 372-2)
This Application Note shows how an electronic load can be used to discharge batteries of various chemistries to determine actual capacity, capacity retention and impedance.

Application Note 2002-02-22

VXI Systems Help Test Crystal Oscillators
This is an electronic manufacturing test case study

Application Note 2001-12-20

Minimizing Power Supply Transient Voltage at a Digital Wireless Telecommunications Products' Test...
This paper addresses the problem of maintaining a stable, transient-free voltage at a DUT

Application Note 2001-11-30

Using Solar Array Simulators
This paper describes solar array simulator (SAS) and how its powerful DSP generates the I-V curve to simulate solar panels.

Application Note 2001-11-17

Using Keysight 6690A Series for Testing Data Storage Control Boards (PN 6690A-1)
These power supplies are designed specifically to test data storage systems from functional to long term environmental testing.

Application Note 2001-09-28

PDF PDF 80 KB
DC Power Supplies for Base Station Testing
This Product Note provides information on how to maximize the utility of the dc power supplies that are in your base station test systems.

Application Note 2001-07-16

Using Keysight 6690A Series System dc Power Supplies for Automobile Battery Simulation (PN 6690A-2)
These power supplies are ideal for simulating the automobile battery under all loading conditions. It can also be used to test electronic equipment while simulating actual battery voltage fluctuations.

Application Note 2001-07-10

PDF PDF 81 KB
Zero Volt Electronic Load
Increasing demand for lower voltage power supplies is pressuring test system designers to identify electronic load test equipment designed to adequately perform at these lower voltages. In this Product Note read about how to configure Keysight DC Electronic Loads, with option J04, to perform...

Application Note 2001-06-07

PDF PDF 141 KB
Cable Impedance and Structural Return Loss Measurement Methodologies
introduces exact definitions for cable impedance and structural return loss along with several measurement methodologies.

Application Note 2001-03-23

Pulsed Characterization of Power Semiconductors Using Electronic Loads (AN 1246)
This Application Note explains how Electronic loads improve power semiconductor measurements by eliminating the self-heating problems associated with measuring the on-state voltage drop and transconductance or current gain of power semiconductors.

Application Note 2000-09-01

PDF PDF 135 KB
TS-5550 Cellular Phone Functional Test Platform (PN TS-5550)
This 12-page color print on demand Product Note discusses the TS-5550 platform features and benefits, including the ability to test up to four celluar phones at once. It is a flexible system for rapid development of cellular phone functional test. Configuration and ordering structure is also given.

Application Note 2000-08-01

Specialized Supplies Target Battery-Powered Products

Application Note 2000-08-01

PDF PDF 73 KB
Sequential Shunt Regulation (AN 1293)
This sequential shunt regulation is widely used for regulating the satellite bus voltage. In this Application Note the Keysight E4350B/E4351B Solar Array Simulators (SAS) are ideal for regulating satellite bus voltage.

Application Note 2000-06-01

PDF PDF 61 KB
10 Hints for Using Your Power Supply to Decrease Test Time - Application Note
Learn how to get the most from your power products by reading this 12-page booklet. When you're trying to boost throughput in time-critical production test systems, a small change in the way you operate or program a supply can have a surprising impact on test speeds. Specifically, the booklet...

Application Note 1999-10-12

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