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How to Maximize the Battery Life of Your Portable IoT Devices - Application Note
Learn how to use the Keysight X8712A IoT device battery life optimization test solution to detect design weaknesses and predict the battery life of an IoT device.

Application Note 2020-05-22

Receiver Test: Overcoming Five Fundamental Challenges - Application Note
Learn how to address five fundamental challenges in the development of wireless receivers.

Application Note 2020-05-12

PDF PDF 2.13 MB
IQ Signal Generation Made Easy - White Paper
This white paper will cover how to generate both ideal and non-ideal IQ signals. We will use the Keysight 33500B and 33600A Trueform Series waveform generators with the IQ Signal Player option to show you how to do this.

Application Note 2020-02-05

How to Perform Low Current and Narrow Pulse Measurements Using the M9601A PXIe SMU
You will learn how to perform low current and narrow pulse measurement through lab exercises using the M9601A PXIe SMU.

Application Note 2020-01-16

Modulation Techniques for Satellite Communications
This white paper focuses on modulation techniques for modern satellite communications from generating and analyzing the signals to the impacts of phase noise on modulation quality.

Application Note 2020-01-11

How to Create Baseband Waveforms and Download Them to RF Vector Signal Generators - Application Note
Understand the hardware structure and requirements for waveform data so that you can generate correct waveforms and download the waveforms into vector signal generators.

Application Note 2019-12-24

When Testing a Device at Multiple Voltages - Use an Output LIST - Application Note
When you need to test a device over a range of power levels, consider using an output LIST. An output LIST allows you to specify a series of steps that change the power supply’s output. Each step controls the output for a set length of time before moving on to the next step.

Application Note 2019-12-02

PDF PDF 2.22 MB
Overcoming LoRa Device RF Measurement Challenges - Application Note
This Application Note offers an introduction to some key LoRa device RF measurement challenges and offers guidance to how users can overcome these using Keysight’s test solutions.

Application Note 2019-12-01

IV and CV Measurement Using the Keysight B1500A MFCMU and SCUU - Application Note
This eight-page application note illustrates how an accurate IV and CV measurement system can be confugured using the B1500A MFCMU and SCUU.

Application Note 2019-10-22

Random Telegraph Noise (RTN) Measurement of Advanced MOSFET using B1500A WGFMU Module
This application note describes random telegraph noise (RTN) measurement in advanced MOSFETs using the B1500A’s WGFMU module and shows actual measurement examples.

Application Note 2019-10-18

1500 A and 10 kV IGBT Characterization by using B1505A - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters found in IGBT specifications.

Application Note 2019-10-14

B1500A: A Complete CMOS Reliability Test Solution - Application Note
This application note gives an overview of the B1500A’s key measurement features and shows how the B1500A is a complete solution for verifying CMOS process reliability.

Application Note 2019-10-14

Accurate and Efficient Characterization of Power Devices at 3000 V/20 A - Application Note
This application note describes the use of the Keysight B1505A Power Device Analyzer/Curve Tracer for accurate and efficient characterization of power devices at 3000 V/20 A.

Application Note 2019-10-12

IGBT Sense Emitter Current Measurement Using the Keysight B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2019-10-10

PDF PDF 2.25 MB
1500 A and 10 kV High-Power MOSFET Characterization using the Keysight B1505 - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters of high-power MOSFETs.

Application Note 2019-10-10

Thyristor Characterization Using the Keysight B1505A Power Device Analyzer/Curve Tracer - Applicatio
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2019-10-10

PDF PDF 1.78 MB
How to Perform QSCV (Quasi-Static Capacitance Voltage) Measurement - Application Note
This application note explains how to perform QSCV (quasi-static capacitance voltage) measurement using Keysight B1500A semiconductor device analyzer.

Application Note 2019-10-10

PDF PDF 3.39 MB
Measuring Pulsed/Transient Electrical Properties of OTFTs - Application Note
The Keysight B1530A WGFMU modules for B1500A combines fast current/voltage measurement and AWG functions and allow user to measure pulsed / transient electrical property of OTFT without nay additional measurement instruments.

Application Note 2019-10-10

Internal Gate Resistance Measurement Using the B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2019-10-10

PDF PDF 2.60 MB
Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2019-10-10

Next Generation Curve Tracer Revolutionizes Failure Analysis - Application Brief
This application note introduces curve tracer mode and windows environment of the B1505A's built-in EasyEXPERT software that will replace conventional analog curve tracers.

Application Note 2019-10-09

Ultra Low Current DC MOSFET Characterization at the Wafer Level - Application Note
This application note discusses the use of the B1500A semiconductor device analyzer for ultra low current DC MOSFET characterization at the wafer level.

Application Note 2019-10-09

Improve Measurement Integrity for RF and Microwave Wideband Signal Generation - White Paper
Discuss the impacts of frequency responses and modulator imperfections on wide bandwidth signals, and how to improve measurement integrity for these impacts.

Application Note 2019-10-03

PDF PDF 5.59 MB
3 Steps to Characterize RF Devices with Stimulus-Response Measurements - White Paper
Perform stimulus-response tests, such as CCDF, harmonics, TOI, ACP, and EVM to understand the performance of the DUT under different conditions to determine the best trade-offs in your design.

Application Note 2019-09-20

The Power of Emulation - Part 2: Ensuring Electric Cars Perform Flawlessly with Emulation
Design and test engineers are turning to emulation technology to reduce the design verification cycle time and reduce the cost of test to help speed up the transition to EVs.

Application Note 2019-08-28

PDF PDF 3.30 MB

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