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임피던스 측정 핸드북

어플리케이션 노트 2012-07-06

Time Domain Analysis With a Network Analyzer Application Note (AN 1287-12)
This document focuses on time domain analysis (displays) generated from vector network analyzers (VNA). The intent is to provide engineers with frequency domain background, an in-depth view of how a time domain display is created from frequency domain data (S-parameters) and how to apply the time domain display to common problems in RF systems.

어플리케이션 노트 2012-05-02

Correlating Impedance Measurements Among Different Types of Measurement Instruments (PN 4291-4)
The 4291B is the advanced impedance analyzer which has the capability to make accurate measurements. This document discusses the data correlation between the 4291B and older instrument.

어플리케이션 노트 2012-04-27

PDF PDF 51 KB
Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

어플리케이션 노트 2012-02-08

Design Tutorial: E5061B ENA Custom Multiport Switch Solution Using L4491A
This application note describes how to configure a 12-port custom switch box with the L4491A switch platform and operation basics using the E5061B network analyzer.

어플리케이션 노트 2011-11-29

PDF PDF 1016 KB
Measurement of a Large Amount of Components by Using a Scanning System (AN 1369-4)
This application note highlights not only the introduction of measurement systems using a LF LCR meter and an impedance analyzer with a scanner but also how to solve issues that relate to residual impedance, which are existing in a scanning system.

어플리케이션 노트 2009-10-28

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

어플리케이션 노트 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8)
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

어플리케이션 노트 2008-11-21

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz)
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

어플리케이션 노트 2008-11-20

High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

어플리케이션 노트 2008-08-21

Total Analysis Environment for Modeling
Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

어플리케이션 노트 2008-08-21

MEMS/NEMS 디바이스 측정 솔루션
키사이트는 MEMS/NEMS 디바이스의 특성 분석을 도와 줍니다.

어플리케이션 노트 2008-06-04

Dielectric Constant Evaluation of Rough Surfaced Materials (PN 4291-5)
This product note describes the technologies and features in the 4291B RF Impedance/Material Analyzer to extend accurate impedance measurements to 1.8 GHz. Advantage of the new V-I impedance technique for direct impedance measurement, cable...

어플리케이션 노트 2008-06-02

PDF PDF 111 KB
ADSL Copper Loop Measurements (PN 4395-1)
This product note provides a practical guidance for the copper loop measurement for ADSL by using the 4395A.

어플리케이션 노트 2008-04-15

PDF PDF 123 KB
Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2)
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

어플리케이션 노트 2008-04-10

PDF PDF 116 KB
Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1)
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

어플리케이션 노트 2008-04-03

PDF PDF 119 KB
Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

어플리케이션 노트 2007-04-13

Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

어플리케이션 노트 2007-04-12

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

어플리케이션 노트 2007-04-04

Characterizing Electromagnetic MEMS Optical Scanner using the E4980A
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

어플리케이션 노트 2007-04-04

16196A/B/C/D Correlating RF Impedance Measurements When Using SMD Test Fixtures
This Product Note explains that the ability to verify the correlation of impedance measurement results is dependent on the variety of factors.

어플리케이션 노트 2007-03-06

Improve Electronic Product Quality and Performance with Keysight Precision LCR Meters (AN 369-9)
This note describes the general application of passive component measurements in incoming inspection and R&D and shows the benefits of Keysight's Precision LCR Meter family; the 4284A and the 4285A 30 MHz LCR meters with digital Q capability.

어플리케이션 노트 2006-06-26

Temperature Characteristic Evaluations of RF Components and Materials (AN 1464)
This application note introduces an efficient and highly reliable measurement system for evaluating temperature characteristics of components and materials using a combination of the E4991A-007.

어플리케이션 노트 2004-10-14

How To Accurately Evaluate Low ESR/High Q RF Chip Devices (AN 1369-6)
This application note discusses the requirements for proper measurement techniques, the right test instrument, and fixtures that can accommodate the minute size of todays RF chip devices.

어플리케이션 노트 2004-01-24

PDF PDF 332 KB
Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Keysight 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

어플리케이션 노트 2003-06-26

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