Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Technical Support

Electronic Measurement

Support by Product Model Number:

1-25 of 76

Sort:
Residual BER - White Paper
Residual BER budgets are essential for maintaining the efficiency of your transmit and receive systems. The most important contribution of residual BER pre¬diction is that it demonstrates mathematical relationships between BER performance and relates key analog metrics. These metrics are used to specify components to digital bit errors, which are used to evaluate systems. This bridges the gap between the network’s service metric and radio engineers’ analog component metrics.

Application Note 2019-02-20

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2019-01-29

Forward Error Correction Solutions - ABCs of Bit Error Rate Testers - White Paper
High data rates, smaller signals, and compressed channels create encoding errors due to unreliable or noisy communication channels. Learn how to combat these errors with Forward Error Correction (FEC) solutions.

Application Note 2018-10-30

Pulse, Pattern, Function, and Arbitrary Waveform Generators - Application Note
This Keysight family of pulse, pattern, function and arbitrary waveform generators can help you verify and characterize digital or analog systems, products, and components.

Application Note 2018-09-17

PDF PDF 2.06 MB
Error Analysis of PAM4 Signals - Application Brief
Increasing demands for a connected world with instant data access continues to drive Ethernet, 64G fiber channel, CEI-56G and other next generation data center networking links.

Application Note 2018-08-17

PCIe 5.0 The Next Generation of Peripheral Component Interconnect - White Paper
Defining the Next Standard in Interconnect Technology

Application Note 2018-07-30

Accelerating from 100GE to 400GE in the Data Center Advanced Modulation and Coding Challenges
The move from 100GE to 400GE in the data center is revolutionary, not evolutionary. Optical transceivers will need to use advanced signal modulation and coding to reach 400GE speeds. These techniques create new test challenges for transceiver manufacturers.

Application Note 2018-05-30

BER Measurement Using Real-Time Oscilloscope Controlled from M8070A - Application Note
The scope of this application note is to explain the BER measurement procedure using the M8045A pattern generator and DSAZ634A oscilloscope when controlled from M8070A system software.

Application Note 2017-12-13

Download latest M8195A AWG application notes - Explore the possibilities in signal generation
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

Application Note 2016-12-09

Download Free Application Notes for new Arbitrary Waveform Generators
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

Application Note 2016-12-08

DOCSIS 3.1 PHY Layer Measurements - Application Note
This app note describes the key RF tests for DOCSIS 3.1 CMTS and CM devices, giving practical guidance for implementing them with commercially-available test instruments.

Application Note 2016-11-02

PDF PDF 11.92 MB
Overcoming Test Challenges of USB Type-C - Application Note
This application note provides an introduction to the USB Type-C connector, the interface functions it provides, and test implications engineers face when integrating the connector into their designs.

Application Note 2016-08-10

PDF PDF 3.19 MB
View PAM-4 Seminar and Application Notes
Cut through the challenges of gigabit digital designs with these useful tools, app notes, and seminars. Keysight - insights for your best design.

Application Note 2016-05-16

How to Test USB Type-C Alt Mode and the Standards Running Across It - Application Note
This application note discusses how Alt mode works with power delivery circuitry to transmit/receive unique data signals/more power, so Type-C can be used for many USB & non-USB, device connections/control.

Application Note 2016-04-29

Download application notes on optical communication test
Get application notes on the latest developments in coherent test signal generation and analysis.

Application Note 2015-10-27

Switching Solutions for Multi-Lane BERT Testing - Application Note
This application note addresses the use of switching solutions, degradations that might be encountered, and the methods to overcome them.

Application Note 2015-10-07

Master your next PCI Express® Test J-BERT M8020A High-Performance BERT - Application Brief
Overview of PCI Express receiver testing for the different transfer speeds as well as different specifications and to present the test setup based on the J-BERT M8020A.

Application Note 2015-05-05

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

Application Note 2015-04-24

PDF PDF 2.22 MB
De-Emphasis Application Note
The N4916A de-emphasis signal converter, an industry-first, enables engineers to accurately characterize multi-gigabit serial receivers and channels that operate with de-emphasized signals.

Application Note 2015-04-08

PDF PDF 4.41 MB
Tips and Techniques for Accurate Characterization of 28 Gb/s Designs - Application Note
The worldwide demand for data capacity in networks greatly increases every year, driven by services like cloud computing and Video on Demand.

Application Note 2014-08-02

USB Design and Test - A Better Way - Application Note
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

Download latest J-BERT M8020A application notes to master your designs
Submit the form to begin downloading the application briefs

Application Note 2014-04-09

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Overcome PCB Loss, Deliver a Clean Eye to Your DUT Using Multi-tap De-emphasis - Application Brief
This application brief describes how Keysight’s 32 Gb/s Pattern Generator with integrated 5-tap de-emphasis can overcome PCB and connector loss and deliver a clean eye to the DUT.

Application Note 2013-07-16

1 2 3 4 Next