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EMC Compliance Testing: Improve Throughput with Time Domain Scanning - Application Note
This application note provides an overview of time domain scan, the test scenarios in which it provides the greatest time savings, and trade-offs between speed and overload protection.

Application Note 2019-08-29

The Power of Emulation - Part 2: Ensuring Electric Cars Perform Flawlessly with Emulation
Design and test engineers are turning to emulation technology to reduce the design verification cycle time and reduce the cost of test to help speed up the transition to EVs.

Application Note 2019-08-28

PDF PDF 3.30 MB
7 Steps to Improve Your DMM Measurement Throughput - White Paper
This article provides seven measurement tips on how to improve measurement throughput using a digital multimeter. Reducing test times translates into lower costs and faster time-to-market; both are important goals in today’s fast-paced and competitive marketplace.

Application Note 2019-08-22

Evaluating Oscilloscope Vertical Noise Characteristics - Application Note
Measurement system noise will degrade your actual signal measurement accuracy, especially when you are measuring low-level signals and noise. Since oscilloscopes are broadband measurement instruments, the higher the bandwidth of the scope, the higher the vertical noise will be – in most situations.

Application Note 2019-08-21

Overcoming RF & MW Interference Challenges in the Field - Application Note
This application note discusses practical strategies to overcome RF and microwave interference challenges in the field using real-time spectrum analysis (RTSA).

Application Note 2019-08-15

Achieving Accurate E-band Power Measurement with Keysight E8486A Waveguide Power Sensors
E-band spectrum application has been gaining more application interests in the recent years. E8486A addresses the requirement for accurate RF power measurement in the mm-wave applications.

Application Note 2019-08-14

5 Things the E5080B Can Do (That the E5071C Can't) - White Paper
The Keysight E5080B vector network analyzer provides a more comprehensive solution for R&D and manufacturing test with useful features to simplify your device test.

Application Note 2019-08-13

PDF PDF 3.74 MB
Bluetooth® 5 Technology Fundamentals and Critical Test Parameters - Application Note
An overview of Bluetooth evolution and what is new in Bluetooth 5, physical layers and critical test requirements for Bluetooth 5, concluded with a brief introduction of Keysight Bluetooth signal generation and signal analysis solutions.

Application Note 2019-08-13

The Why, What, and How of Analog Demodulation Measurements - White Paper
In this white paper, you will learn what analog modulation is, why it useful, and a tip for measuring modulated signals.

Application Note 2019-07-25

PDF PDF 9.36 MB
EMI Pre-Compliance Fundamentals - White Paper
Learn how to make radiated and conducted emissions measurements.

Application Note 2019-07-23

Evaluating Oscilloscope Signal Integrity - Application Note
This application note articulates key signal integrity attributes and uses Keysight Infiniium S-Series oscilloscopes for examples in the 500 MHz to 8 GHz bandwidth ranges.

Application Note 2019-07-10

Power Sensor Overpower Failure Verification Guideline - Application Note
Describes the TDR method to verify failure due to overpower

Application Note 2019-07-02

PDF PDF 810 KB
Measuring Insulating Material Resistivity Using the B2985A/87A - Application Note
This application note explains how easy it is to make an resistivity measurement using the B2980A Series.

Application Note 2019-06-27

Four Measurements on the Go
Learn about four important measurements you can make on the go with the FieldFox Handheld Analyzer, including Noise Figure, Real-Time Spectrum Analysis (RTSA), Cable and Antenna Testing (CAT), and Over-the -Air (OTA).

Application Note 2019-06-06

PDF PDF 2.86 MB
Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

Application Note 2019-06-04

PDF PDF 2.42 MB
Portable Multichannel/Multi-Module Streaming/Recording Solutions Using M9203A and PXIe RAID Storage
This application note explains how to construct a portable M9203A streaming solution, and suggests configurations that maximize streaming/recording performance for up to 8 channels.

Application Note 2019-05-31

Top 5 Strategies for 5G Component Characterization and Test - White Paper
For 5G, component manufacturers need to deploy effective strategies for characterization and test including multiport testing, modular instrumentation, and multisite testing.

Application Note 2019-05-23

Electronic Load Fundamentals - White Paper
This White Paper discusses fundamentals of an electronic load including: electronic load operation modes, e-load applications and how to select the right electronic load.

Application Note 2019-05-11

No Programming Required: Multisignal Capture and Analysis DMMs - Application Note
This white paper explores how BenchVue can help you acquire multiple signals concurrently and interpret the data you receive from them faster. You will also learn how it helps you quickly synchronize measurements, graph measurements, and export data in a variety of common formats.

Application Note 2019-05-02

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2019-04-25

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2019-04-04

Using Microwave Switches When Testing High Speed Serial Digital Interfaces
Many high speed digital interfaces use multiple lanes to achieve their system's throughput requirements. Most issues associated with this can be resolved with a switching network.

Application Note 2019-04-03

TDECQ Part II, Manufacturing Test Recommendations - White Paper
An overview of how to make a compliant TDECQ measurement on a PAM4 optical transmitter

Application Note 2019-03-29

PDF PDF 4.21 MB
Bipolar Transistor Characterization Using the B2900A Series of SMUs - Application Note
This application note describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

Application Note 2019-03-26

TDECQ Testing or PAM4 Optical Transceivers - White Paper
An overview of how to make a compliant TDECQ measurement on a PAM4 optical transmitter

Application Note 2019-03-26

PDF PDF 2.70 MB

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