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Electronic Measurement

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1-25 of 1179

Best Practices for Using the CX3300A’s Data Logger Mode for Long Duration Measurement
The CX3300A’s data logger mode records the precise current and voltage waveform at high sampling rate and offers quick analysis functions. This application note shows how effectively you can use them.

Application Note 2019-11-07

Investigate Interference Issues in the Field with RTSA - White Paper
Interference is everywhere — and traditional analysis isn’t reliable. This white paper discusses interference sources, the flaws of traditional analysis, and how RTSA aids interference detection.

Application Note 2019-11-06

Effective Multi-tap Transformer Measurement using a Scanner and the 4263B LCR Meter – App Note
This application note shows an effective multi-tap transformer measurement using a scanner and the 4263B LCR Meter.

Application Note 2019-11-05

Discover the Best Oscilloscope - Keysight InfiniiVision vs Tektronix 4 Series - White paper
With so many high-quality oscilloscopes available today, determining which is the best for your testing needs can be difficult. Learn the key differences between the Keysight InfiniiVision oscilloscopes and the Tektronix 4 Series oscilloscopes to discover the right oscilloscope for your bench.

Application Note 2019-10-24

IV and CV Measurement Using the Keysight B1500A MFCMU and SCUU - Application Note
This eight-page application note illustrates how an accurate IV and CV measurement system can be confugured using the B1500A MFCMU and SCUU.

Application Note 2019-10-22

Random Telegraph Noise (RTN) Measurement of Advanced MOSFET using B1500A WGFMU Module
This application note describes random telegraph noise (RTN) measurement in advanced MOSFETs using the B1500A’s WGFMU module and shows actual measurement examples.

Application Note 2019-10-18

Exploring the Architectures of Network Analyzers (1287-2) – Application Note
This Application Note explains that Network analyzers have become one of the most important tools for characterizing the performance of high-frequency components and devices.

Application Note 2019-10-17

B1500A: A Complete CMOS Reliability Test Solution - Application Note
This application note gives an overview of the B1500A’s key measurement features and shows how the B1500A is a complete solution for verifying CMOS process reliability.

Application Note 2019-10-14

1500 A and 10 kV IGBT Characterization by using B1505A - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters found in IGBT specifications.

Application Note 2019-10-14

Accurate and Efficient Characterization of Power Devices at 3000 V/20 A - Application Note
This application note describes the use of the Keysight B1505A Power Device Analyzer/Curve Tracer for accurate and efficient characterization of power devices at 3000 V/20 A.

Application Note 2019-10-12

How to Perform QSCV (Quasi-Static Capacitance Voltage) Measurement - Application Note
This application note explains how to perform QSCV (quasi-static capacitance voltage) measurement using Keysight B1500A semiconductor device analyzer.

Application Note 2019-10-10

Measuring Pulsed/Transient Electrical Properties of OTFTs - Application Note
The Keysight B1530A WGFMU modules for B1500A combines fast current/voltage measurement and AWG functions and allow user to measure pulsed / transient electrical property of OTFT without nay additional measurement instruments.

Application Note 2019-10-10

Capacitance Measurement Basics for Device/Material Characterization - Application Note
This application note explains capacitance measurement basics for device/material characterization using Keysight B1500A Semiconductor Device Analyzer.

Application Note 2019-10-10

Internal Gate Resistance Measurement Using the B1505A - Application Note
This application note explains how to measure power device internal gate resistance using the B1505A and also shows an actual example measurement.

Application Note 2019-10-10

IGBT Sense Emitter Current Measurement Using the Keysight B1505A - Application Note
This application note introduces how the sense emitter current, emitter current and built-in temperature sensor current/voltage of IGBT can be measured simultaneously by using the B1505A.

Application Note 2019-10-10

Thyristor Characterization Using the Keysight B1505A Power Device Analyzer/Curve Tracer - Applicatio
This application note provides an overview of thyristor electrical characterization using the B1505A.

Application Note 2019-10-10

1500 A and 10 kV High-Power MOSFET Characterization using the Keysight B1505 - Application Note
This application note explains how to use the B1505A Power Device Analyzer / Curve Tracer to measure typical DC parameters of high-power MOSFETs.

Application Note 2019-10-10

Next Generation Curve Tracer Revolutionizes Failure Analysis - Application Brief
This application note introduces curve tracer mode and windows environment of the B1505A's built-in EasyEXPERT software that will replace conventional analog curve tracers.

Application Note 2019-10-09

Ultra Low Current DC MOSFET Characterization at the Wafer Level - Application Note
This application note discusses the use of the B1500A semiconductor device analyzer for ultra low current DC MOSFET characterization at the wafer level.

Application Note 2019-10-09

Using Noise Floor Extension in an X-Series Signal Analyzer - Application Note
With sufficient processing and other technical innovations, the noise power in a signal analyzer can be modeled and subtracted from measurement results to reduce the effective noise level.

Application Note 2019-10-07

Network Analyzer Measurements: Filter and Amplifier Examples
The network analyzer is used for a variety of device and component characterization tasks in both laboratory and production environments.

Application Note 2019-10-07

Automotive Serial Bus Testing Using Oscilloscopes - White Paper
Learn how to use oscilloscopes to characterize the performance of your automotive buses including CAN, CAN FD, LIN, FlexRay, and SENT.

Application Note 2019-10-04

Overcoming RF & MW Interference Challenges in the Field - Application Note
This application note discusses practical strategies to overcome RF and microwave interference challenges in the field using real-time spectrum analysis (RTSA).

Application Note 2019-09-30

10 Hints for Making Successful Noise Figure Measurements - Application Note
This document will help minimize the uncertainties in your noise figure measurements. Key topics include minimizing extraneous signals, mismatch uncertainties, nonlinearities, and path losses.

Application Note 2019-09-25

3 Steps to Characterize RF Devices with Stimulus-Response Measurements - White Paper
Perform stimulus-response tests, such as CCDF, harmonics, TOI, ACP, and EVM to understand the performance of the DUT under different conditions to determine the best trade-offs in your design.

Application Note 2019-09-20


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