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[Mounting on ECU boards] Pinpointing Open Joints for Pads for BGAs and Connectors!

ブローシャ 2018-02-01

PDF PDF 1.23 MB
【ECU基板実装】BGAやコネクタの足浮きをピンポイントで検出!非接触センサー技術 VTEP

ブローシャ 2018-01-15

PDF PDF 1.31 MB
Limited Parts Agreement
Keysight understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

ブローシャ 2017-12-01

PDF PDF 552 KB
Preserve your i3070 investment with our suite of Keysight i3070 Upgrade Support Agreements - Flyer
This one-pager contains an overview of Keysight i3070 Upgrade Support Agreements to better preserve your investment and enhance test capabilities on your i3070.

ブローシャ 2017-06-05

PDF PDF 261 KB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

ブローシャ 2015-02-12

PDF PDF 212 KB
In-Circuit Test Suite - Brochure
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

ブローシャ 2015-02-01

PDF PDF 10.42 MB
ピンレベルでの故障解析を可能にし製造コスト/解析コストを削減
ピンレベルでの故障解析を可能にし製造コスト/解析コストを削減

ブローシャ 2014-10-16

PDF PDF 512 KB
Maximize Your Keysight AXI Coverage with Flexible Pricing - Brochure
This flyer describes the different support options Keysight AXI users can select from to ensure peace of mind for covering the support needs of their 5DX and x6000 investments.

ブローシャ 2014-07-31

PDF PDF 141 KB
Keysight Medalist i3070 In-Circuit Test System Onsite Calibration Service
This flyer explains why calibration is one of the critical factors that will help maintain the accuracy and repeatability of your Medalist i3070 ICT system.

ブローシャ 2014-07-31

PDF PDF 54 KB
Return-to-Keysight Agreement for i3070 In-Circuit Test Systems - Brochure
Return to Keysight is a repair service agreement for your Keysight i3070 and 3070 in-circuit test systems to ensure your system uptime is maximized.

ブローシャ 2014-01-15

PDF PDF 2.93 MB
Refresh your Keysight 3070 In-Circuit Test System with Keysight’s 3-in-1PC Upgrade
The Keysight 3-in-1 PC Upgrade Support Agreement enables customers to replace their legacyAgilent3070 In-Circuit Test Systemtest head controller with the latest PC controller and gain access to the latest Keysight ICT features and capabilities.

ブローシャ 2012-07-25

PDF PDF 242 KB
One Stop Shop In-Circuit Test Support Services - Brochure
Keysight's seamless support helps keep your in-circuit testers running smoothly, so you can focus on delivering quality to your customers,quickly.

ブローシャ 2012-02-16

PDF PDF 694 KB
Medalist VTEP v2.0 Powered, with Cover-Extend technology
This brochure provides an overview of Cover-Extend under the VTEP v2.0 Powered vectorless test suite

ブローシャ 2010-04-06

PDF PDF 237 KB
Get the i3070 from just $71K
This offer program is only valid for customers in the United States, Canada, Mexico and Brazil.

プロモーション資料 2009-09-26

Choose the Services that Best Fit your Needs
Keysight offers several ways for you to purchase Uptime Support Services for your Keysight test and inspection systems, depending on your needs and budget. This brochure provides the available options.

ブローシャ 2009-04-13

PDF PDF 100 KB
キーサイト・カーエレクトロニクス計測ソリューション

ブローシャ 2008-07-11

PDF PDF 2.68 MB
Keysight Medalist Test & Inspection Family Brochure
This brochure provides an overview of the test and inspection solutions offered by Keysight for ICT, AOI, AXI and Automotive Functional Test.

ブローシャ 2008-03-14

PDF PDF 496 KB
Medalist i3070インサーキット・テスト・システム
i3070 は、世界で数多くお使い頂いている3070シリーズの高いフレキシビリティと、i5000 の先進のグラフィカル・ユーザ・インタフェースを兼ね備えた最新のインサーキット・テスト・システムです。

ブローシャ 2007-03-12

PDF PDF 896 KB
Medalist i3070 In-Circuit Test Platform
Keysight Medalist i3070 is the next generation In-Circuit Test System (ICT) that provides significant return of investment with unparalleled test coverage and robustness.

ブローシャ 2007-01-10

PDF PDF 1.18 MB
Study and Recommendations Into Using Lead Free PCBs at In-Circuit Test
ICT relies on good contact between the test probe and test pad. On OSP boards, it is important that the stencil allows solder paste to be applied to testpoints.

プロモーション資料 2005-06-09

PDF PDF 214 KB
CCGA Lead-Free Study
Reliability Testing and Data Analysis of an 1657CCGA (Ceramic Column Grid Array) Package with Lead-Free Solder Paste on Lead-Free PCBs (Printed Circuit Boards).

プロモーション資料 2004-06-04

PDF PDF 480 KB