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Maximising Test Coverage with Keysight Medalist VTEP v2.0
This paper describes how to get the most from Keysight Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

應用手冊 2007-04-17

Keysight Medalist i3070 07.00p Software Release
The Keysight Medalist i3070 In-circuit test 07.00p software adds new test throughput enhancements in test development and debug as well as in test execution. .

版本須知 2007-02-21

PDF PDF 93 KB
Medalist i3070 In-Circuit Test System
Product Specification for the Keysight Medalist i3070 is the next generation In-Circuit Test System (ICT).

產品型錄 2007-01-23

Medalist i3070 In-Circuit Test Platform
Keysight Medalist i3070 is the next generation In-Circuit Test System (ICT) that provides significant return of investment with unparalleled test coverage and robustness.

型錄 2007-01-10

PDF PDF 1.18 MB
Applying a New In-Circuit Probing Technique for High-Speed/High Density Printed Circuit Boards
Bead probes were used to obtain additional test access on a high-density production printed circuit board. This case study includes practical information and key bead-specific learnings discovered during the process of outsourcing.

應用手冊 2006-10-24

Bead Probe Technology Flash Demonstration
View how bead probe technology works.

基本展示 2006-10-23

Medalist Bead Probe Technology Product Overview
Proven technology for placing test targets directly on printed circuit board signal traces.

技術總覽 2006-10-01

i5000 06.02p Software
The Keysight Medalist i5000 In-circuit test 06.02p adds intelligent Vectorless Test Extended Performance (iVTEP) to the software.

版本須知 2006-09-01

Lead-Free Cost Savings Analysis
This cost-savings calculator shows savings when deploying test on lead-free, as well as VTEP cost savings when compared to TestJet.

應用手冊 2005-09-09

XLS XLS 39 KB
ITF 3.1 File Directory Structure
This concise document provides information on the ITF3.1 File directory structure on the ITF server, Tester and Client applications (ART & AQT viewers).

使用手冊 2005-04-04

PDF PDF 146 KB
ITF 3.1 Server Setup Guide
This guide provides a step-by-step procedure on how to set up your own File Server, starting with installing the OS, MS SQL and finally MTSS ITF software using a Compaq ML370 Server as an example.

安裝手冊 2005-04-01

PDF PDF 884 KB
ITF 3.1 Setup Guide
Provides instructions on how to install and configure the Intelligent Test Framework Server and ART/AQT Viewer Client applications.

安裝手冊 2005-04-01

PDF PDF 2.83 MB
Selcom Testimonial
Customer testimonial which discusses the advantages gained from using the Keysight Medalist Family of test and inspection systems.

案例研究 2005-03-14

WMF WMF 19.21 MB
AQT 3.1 User Guide
This user guide offers simple tips on how to use AQT for different operating needs.

使用手冊 2005-02-01

PDF PDF 3.23 MB
ART 3.1 User Guide
This user guide offers simple tips on how to use ART for different operating needs.

使用手冊 2005-02-01

PDF PDF 3.77 MB
ITF 3.1 Reference Guide
Provides useful information to help user select and configure the file storage system, backup and restore data on the ITF server, how to configure the communication ports, troubleshooting network issues and more.

使用手冊 2005-01-10

PDF PDF 689 KB
ITF 3.1 Upgrade Guide
For those intending to upgrade to ITF 3.1 from the ITF 3.0 platform, this guide is a step-by-step platform migration procedure.

安裝手冊 2005-01-01

PDF PDF 1.23 MB
ITF 3.1 User Guide
Updated user guide for Intelligent Test Framework Software Solutions, Revision 3.1.

使用手冊 2005-01-01

PDF PDF 2.56 MB
Traceable Calibration for 3070
As test equipment ages, system performance degrades. Keysight can help protect your investment with NIST traceable system calibration.

專題報導 2004-12-13

Medalist Quality Tool (Formerly AQT) Optimization Guide
This guide offers simple tips on how to use AQT for different operating needs.

使用手冊 2004-10-22

PDF PDF 1.11 MB
VTEP Coverage Analysis
How much additional coverage can you really get with VTEP? The VTEP Coverage Analysis Tool provides a realistic estimate.

應用手冊 2004-10-04

VTEP ROI Analysis
Discover how VTEP compares to existing technologies that are already in use worldwide.

應用手冊 2004-10-04

Controlling PB-Free Processes Through AOI
Written by Thorsten Niermeyer, Keysight Technologies. Article and cover published in Circuits Assembly, October 2004.

專文 2004-10-01

Safeguard and Low Voltage
Documents summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

應用手冊 2004-08-30

3070 05.31: PDU/POD Upgrade
Describes how to install the E1135C PDU and Pod upgrade.

安裝手冊 2003-12-01

PDF PDF 670 KB

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