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Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

어플리케이션 노트 2019-04-25

TDECQ Part II, Manufacturing Test Recommendations - White Paper
An overview of how to make a compliant TDECQ measurement on a PAM4 optical transmitter

어플리케이션 노트 2019-03-29

PDF PDF 4.21 MB
TDECQ Testing or PAM4 Optical Transceivers - White Paper
An overview of how to make a compliant TDECQ measurement on a PAM4 optical transmitter

어플리케이션 노트 2019-03-26

PDF PDF 2.70 MB
Residual BER - White Paper
Residual BER budgets are essential for maintaining the efficiency of your transmit and receive systems. The most important contribution of residual BER pre¬diction is that it demonstrates mathematical relationships between BER performance and relates key analog metrics. These metrics are used to specify components to digital bit errors, which are used to evaluate systems. This bridges the gap between the network’s service metric and radio engineers’ analog component metrics.

어플리케이션 노트 2019-02-20

USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

어플리케이션 노트 2019-01-29

Forward Error Correction Solutions - ABCs of Bit Error Rate Testers - White Paper
High data rates, smaller signals, and compressed channels create encoding errors due to unreliable or noisy communication channels. Learn how to combat these errors with Forward Error Correction (FEC) solutions.

어플리케이션 노트 2018-10-30

Pulse, Pattern, Function, and Arbitrary Waveform Generators - Application Note
This Keysight family of pulse, pattern, function and arbitrary waveform generators can help you verify and characterize digital or analog systems, products, and components.

어플리케이션 노트 2018-09-17

PDF PDF 2.06 MB
An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

어플리케이션 노트 2018-07-25

Bandwidth and Rise Time Requirements for Making Accurate Oscilloscope Measurements
How much oscilloscope bandwidth do you need and how fast does the rise time need to be to measure your signals accurately?

어플리케이션 노트 2017-12-01

PDF PDF 2.26 MB
Understanding the Right Metrics to use when Evaluating Oscilloscope Quality - Application Note
For scopes with bandwidth in the GHz range, a quality metric involves characterizing the analog-to-digital converter (ADC) using effective number of bits (ENOB). How important is ENOB?

어플리케이션 노트 2017-12-01

8 Hints for Better Scope Probings - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

어플리케이션 노트 2017-11-23

기본 오실로스코프 기초 - 어플리케이션 노트
이 어플리케이션 노트에서는 기본 오실로스코프 기초에 대해 개괄적으로 설명하며 오실로스코프의 정의와 사용 방법에 대해 배울 수 있습니다.

어플리케이션 노트 2017-04-25

Download latest M8195A AWG application notes - Explore the possibilities in signal generation
Get app notes for digital multilevel signalizing techniques and high-speed coherent optical

어플리케이션 노트 2016-12-09

Download Free Application Notes for new Arbitrary Waveform Generators
Here you can download free application notes for new Arbitrary Waveform Generators (AWGs)

어플리케이션 노트 2016-12-08

Reduce your test time with a new 4-in-1 pulse generator - download free application notes
Reduce your test time with a new 4-in-1 pulse generator - download free application notes

어플리케이션 노트 2016-12-07

DOCSIS 3.1 PHY Layer Measurements - Application Note
This app note describes the key RF tests for DOCSIS 3.1 CMTS and CM devices, giving practical guidance for implementing them with commercially-available test instruments.

어플리케이션 노트 2016-11-02

PDF PDF 11.92 MB
Overcoming Test Challenges of USB Type-C - Application Note
This application note provides an introduction to the USB Type-C connector, the interface functions it provides, and test implications engineers face when integrating the connector into their designs.

어플리케이션 노트 2016-08-10

PDF PDF 3.19 MB
View PAM-4 Seminar and Application Notes
Cut through the challenges of gigabit digital designs with these useful tools, app notes, and seminars. Keysight - insights for your best design.

어플리케이션 노트 2016-05-16

How to Test USB Type-C Alt Mode and the Standards Running Across It - Application Note
This application note discusses how Alt mode works with power delivery circuitry to transmit/receive unique data signals/more power, so Type-C can be used for many USB & non-USB, device connections/control.

어플리케이션 노트 2016-04-29

Download application notes on optical communication test
Get application notes on the latest developments in coherent test signal generation and analysis.

어플리케이션 노트 2015-10-27

Switching Solutions for Multi-Lane BERT Testing - Application Note
This application note addresses the use of switching solutions, degradations that might be encountered, and the methods to overcome them.

어플리케이션 노트 2015-10-07

Master your next PCI Express® Test J-BERT M8020A High-Performance BERT - Application Brief
Overview of PCI Express receiver testing for the different transfer speeds as well as different specifications and to present the test setup based on the J-BERT M8020A.

어플리케이션 노트 2015-05-05

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

어플리케이션 노트 2015-04-24

PDF PDF 2.22 MB
Time Domain Reflectometry Theory - Application Note
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

어플리케이션 노트 2015-01-30

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

어플리케이션 노트 2014-08-02

PDF PDF 1.94 MB

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