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TS-5000 Family of Automotive Electronics Functional Test Systems
This is the configuration guide to help you select the Automotive Electronics Functional Test System

Configuration Guide 2008-08-27

PDF PDF 2.31 MB
PSA Spectrum Analyzer Wide Bandwidth Vector Signal Analysis Measurements Technical Overview
Technical overview for the 300 MHz wide bandwidth vector signal analysis measurements to 50 GHz center frequency can now be realized in the PSA series spectrum analyzer: E4440A, E4443A, E4445A, E4446A, E4448A.

Technical Overview 2008-07-22

PDF PDF 8.80 MB
U2972A CCFL Panel Test Solution Operating Guide
This U2972A Operating Guide describes how to use the Keysight U2972A CCFL Panel Test Solution.

Operation Manual 2008-07-15

U2972A Application Note
This application note describes a backlight panel test solution that does not only eliminate potential human errors, but also increases the test speed to achieve a higher manufacturing throughput.

Application Note 2008-07-15

U2972A CCFL Panel Test Solution Data Sheet
Technical specifications and information for the U2972A CCFL Panel Test Solution.

Data Sheet 2008-07-15

RF and Microwave Switching Solutions Brochure
This brochure describes Keysights' RF and Microwave Switching Solutions and includes the product groups and key specifications.

Brochure 2008-07-04

PDF PDF 1.05 MB
Software I/O Layers - VISA, VISA COM, SICL, Keysight 488 - Technical Overview
Keysight has 4 software libraries for instrument control: VISA, VISA COM, SICL, Keysight 488...

Technical Overview 2008-07-01

Automotive Power Window Regulator Testing - Application Note
Automotive power window regulator tests require the use of accurate data acquisition devices, as they cover a wide range of parameters such as window movement, acceleration of the window movement in both directions, maximum range of movement, torque exerted at the start, the end stall torque, and motor load characteristics.

Application Note 2008-06-30

PDF PDF 280 KB
N824xA and N603xA Software Upgrade Notice
This notice applies to instruments that have been returned to Agient for repair.

Release Notes 2008-06-16

PDF PDF 38 KB
N8241A and N6030A Arbitrary Waveform Generators with option 350: Function Generator

Technical Overview 2008-06-13

Keysight Yellowstone 3.0 Automated Test Process Center Technical Overview
This brochure describes the capabilities of the Keysight Yellowstone 3.0 automated test process center.

Data Sheet 2008-06-02

PDF PDF 852 KB
Small Engine Dynamometer Testing - Application Note
Performing Dynamometer Testing on Combustion Engines

Application Note 2008-06-01

PDF PDF 443 KB
Generate complex waveforms with the best signal quality
wo-page photo card explaining the value of using the N6030A and the N8241A waveform generators for wide bandwidth and high resolution results.

Promotional Materials 2008-04-04

PDF PDF 411 KB
Keysight Medalist Test & Inspection Family Brochure
This brochure provides an overview of the test and inspection solutions offered by Keysight for ICT, AOI, AXI and Automotive Functional Test.

Brochure 2008-03-14

PDF PDF 496 KB
N8201A Performance Downconverter, Data Sheet

Data Sheet 2008-02-28

N8200A Series CD Documentation
CD documentation originally shipped with the N82xxA instrument.

User Manual 2008-02-01

ZIP ZIP 269.07 MB
N8200A Series Synthetic Instrument Modules, Rack Configuration Guide

Application Note 2008-01-24

PDF PDF 17.32 MB
N8201A Performance Downconverter, User's Guide
User's manual.

User Manual 2008-01-22

PDF PDF 2.99 MB
TS-5000 Family
Keysight TS-5000 Family of Automotive Electronics Functional Test Systems Brochure

Brochure 2008-01-17

PDF PDF 2.15 MB
N8201A Performance Downconverter, User’s and SCPI Programming Guide

Programming and Syntax Guide 2008-01-15

PDF PDF 4.75 MB
The Benefits of Using LXI in Automotive Functional Test
LXI can help maximize performance, minimize cost and extend capital investments into the future. This whitepaper explores the benefits associated with using LXI in Automotive Functional test.

Application Note 2007-11-29

PDF PDF 471 KB
Gain Compression Application for Amplifier Test
Amplifier designers and manufacturers characterize the compression level of amplifiers so the performance of RF chains or RF subsystems can be determined and optimized.

Technical Overview 2007-11-10

Keysight TS-5040 Automotive Functional Test System

Brochure 2007-10-29

PDF PDF 829 KB
Keysight LXI Timing and Events Users Guide
Introduction to Keysight LXI API for developing I/O applications.

User Manual 2007-10-26

Keysight IO Libraries Suite 15.0 SICL Users Guide
Usage information on the SICL library for programming instruments.

User Manual 2007-10-26

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