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Beam Lead Diode Bonding and Handling Procedures - Application Note
This application note explains how to handle diodes to reduce the risk of damage by static electricity or damage during testing and assembly.

Application Note 2014-08-03

PDF PDF 108 KB
GS-8800 Conformance System Measurement Uncertainty - Application Note
This application note explains how measurement uncertainty (MU) affects GS-8800 system measurements and demonstrates how MU is derived for the conformance test system.

Application Note 2014-08-02

PDF PDF 209 KB
Tips and Techniques for Accurate Characterization of 28 Gb/s Designs - Application Note
The worldwide demand for data capacity in networks greatly increases every year, driven by services like cloud computing and Video on Demand.

Application Note 2014-08-02

All-states measurement method for PDL and PER with a synchronous polarization scrambler
This synchronized all-states PDL method using the Keysight N7785B synchronous scrambler shortens total measurement time and removal of the polarization dependence of the setup from PDL and PER results.

Application Note 2014-08-02

PDF PDF 590 KB
SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

PDF PDF 1.94 MB
Reducing Cost of Testing Prototypes with the Keysight Medalist i1000D In-Circuit
This case study challenges the conventional adoption of flying probers for board testing at the NPI stage, offering the Keysight Medalist i1000D as a viable option which can help save time and money.

Application Note 2014-08-01

Understanding and Using Offset in InfiniiMax Active Probes - Application Note
This application note explains how offset is applied in the Keysight InfiniiMax Active Probes and how to use offset for various applications

Application Note 2014-07-31

Performing Digital-IF/RF-Digital Bit Error Rate Measurement - Application Note
This Application Note describes how to use Keysight Instruments and ADS EDA software to verify RF performance measures such as BER and EVM for end-to-end digital-IF/RF-digital systems--from bits in to bits out.

Application Note 2014-07-31

PDF PDF 531 KB
Understanding Oscilloscope Frequency Response & Its Effect on Rise-Time Accuracy - Application Note
In this application note, we review the properties of both Gaussian and flat-response oscilloscopes, then discuss rise time accuracy for each response type. We show that flat-response oscilloscope, give more accurate rise-time measurement than a Gaussian-response oscilloscope of equal bandwidth, and we show you how to estimate the bandwidth you need. The application note will show you which type of frequency response offers the best measurement accuracy; there are two issues to consider, the maximum signal frequency, and the oscilloscope sampling alias errors. It will also determine how much bandwidth you need.

Application Note 2014-07-31

Photonic Foundation Library Fast Sweep PDL - Application Note
This application note describes an approach to significantly reduce the measurement time associated with polarization dependent loss (PDL) measurements.

Application Note 2014-07-31

PDF PDF 680 KB
Measuring IL and PDL spectra with the fast-switching N7786B - Application Note
The advantages and details of a new method for swept-wavelength IL and PDL measurement is introduced, including configuration details for the necessary instruments and software.

Application Note 2014-07-31

PDF PDF 582 KB
Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Keysight Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

Application Note 2014-07-31

PDF PDF 8.81 MB
Polarization-Resolved Measurements using Mueller Matrix Analysis - Application Note
Polarization-Resolved Measurements using Mueller Matrix Analysis - Application Note

Application Note 2014-07-31

PDF PDF 1 MB
Metrology of Optical Advanced Modulation Formats
The metrology basics of advanced optical modulation formats are presented.

Application Note 2014-07-31

PDF PDF 223 KB
PDL Measurements Using the Keysight 8169A Polarization Controller
This product note discusses the polarization dependent loss (PDL) measurement process; in particular using the 8169APolarization controller.

Application Note 2014-07-31

PDF PDF 726 KB
State of the Art Characterization of Optical Components for DWDM Applications
Fiber optic network technology is taking a big step forward with the tremendous transmission capacity offered by dense wavelength-division multiplexing (DWDM).

Application Note 2014-07-31

Photonic Foundation Library: Enhancing Swept Loss Measurements - Application Note
This application note describes the measurement functionality and the accuracy enhancements enabled by the know-how contained in the Photonic Foundation Library.

Application Note 2014-07-31

PDF PDF 3.90 MB
Digital Modulation in Communications Systems - Application Note
This application note introduces the concepts of digital modulation used in many communications systems today.

Application Note 2014-07-31

PDF PDF 2.64 MB
USB Design and Test - A Better Way - Application Note
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

Does your TLS have specifications pertinent to swept measurements? - Techincal Overview
This technical note describes the parameters given in the specifications of the TLS that are pertinent to dynamic conditions (that is, swept measurements).

Application Note 2014-07-31

PDF PDF 252 KB
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

Measuring the Dependence of Optical Amplifiers on Input Power Using an Attenuator
This application note describes the important optical amplifier properties of gain and noise figures and their dependence on the powers and wavelengths of the input signals.

Application Note 2014-07-31

PDF PDF 347 KB
Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

New Investigations into Energy: Keysight Nanomeasurement Systems - Application Note
The data presented demonstrates just a few of the ways in which the latest atomic force microscopy (AFM), nanoindentation, and field-emission scanning electron microscope can be utilized to enhance energy-related materials research.

Application Note 2014-04-24

PDF PDF 2.58 MB
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Application Note 2014-04-09

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