Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Technical Support

Electronic Measurement

Support by Product Model Number:

101-125 of 1026

Sort:
8 Hints for Better Scope Probings - Application Note
In this application note, you will find eight useful hints for selecting the right probe for your application and for making your oscilloscope probing better.

Application Note 2017-11-23

Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.

Application Note 2017-11-21

PDF PDF 2.10 MB
Six Reasons Your New IoT Device Will Fail - Application Note
You’ve carefully tested your new IoT wireless device. What did you forget that could cause your device to work perfectly in the lab but fail in the real world?

Application Note 2017-11-13

How to Select the Right Current Probe - Application Note
Oscilloscope current probes enable oscilloscopes to measure current, extending their use beyond just measuring voltage. Basically, current probes sense the current flowing through a conductor and convert it to a voltage that can be viewed and measured on an oscilloscope. There are many different types of current probes you can choose from and each probe has an area where it performs best. This application note will introduce you to the common types of current probe solutions, the fundamental principles, the advantages and limitations between each current probe type, and the practical consideration for using current probes for oscilloscope applications to make the most out of them.

Application Note 2017-11-09

Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

Application Note 2017-11-08

PDF PDF 8.01 MB
Oscilloscope in Medical Imaging Applications - Measuring Power Integrity and Current Measurement
This application brief explores how Keysight oscilloscopes help designers validate the medical instrument’s IO interface for data processing in image reconstruction.

Application Note 2017-11-06

PDF PDF 553 KB
How to Test USB Power Delivery (PD) Over Type-C - Application Note
USB Type-C power delivery creates possibilities for USB connected devices with higher, bi-directional power and power for non-USB devices with ALT mode. Learn more about verification/compliance.

Application Note 2017-11-01

Temperature Measurement Solution for Solar Cell and Module Testing - Application Note
This application note highlights key products that can be used to help you effectively and efficiently test solar cells and solar modules, and ensure that they are able to perform optimally.

Application Note 2017-10-25

Automated Configuration of Scan Path Linkers Using x1149 - Application Note
The automated scan path linker configuration feature introduced with the release of software version 1.6.0.0 simplifies scan path linker configuration for five scan path linker devices commonly used in the industry.

Application Note 2017-10-10

PDF PDF 2.64 MB
Testing 5G: Data Throughput - Application Note
This application note describes the new challenges of testing high data rates and provides a solution to these challenges using Keysight’s Protocol R&D Toolset.

Application Note 2017-09-30

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2017-09-06

Coherent Optical Communications Test Challenges - Application Note
This Application Note focuses on the test and troubleshooting of next-generation fiber-based communication systems tasked with supporting 100 Gb/s, 400 Gb/s data rates and higher.

Application Note 2017-08-31

Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

Application Note 2017-08-21

PDF PDF 5.16 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

Application Note 2017-08-21

PDF PDF 598 KB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

Application Note 2017-08-18

PDF PDF 4.22 MB
Narrowband IoT (NB-IoT): Cellular Technology for the Hyperconnected IoT - Application Note
This paper explains the underlying reasons why this technology is shaped as it is today and explore the challenges in adopting this new application and explains the new ways of securely roll out NB-IoT application quickly to market.

Application Note 2017-08-08

Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.

Application Note 2017-07-31

Optical Signal Measurements Using A Real-Time Oscilloscope - Application Note
If your application includes a repetitive waveform that requires lower noise, jitter and a higher dynamic range, a sampling oscilloscope is a good choice.

Application Note 2017-06-27

PDF PDF 907 KB
Automotive RF/MW System Verification and Troubleshooting Tests Using FieldFox Handheld Analyzers
This application note discusses the RF and microwave systems in the 21st century car and the challenges to verify their operation and troubleshoot faulty issues.

Application Note 2017-06-21

Medalist i3070 Test Throughput Optimization - Application Note
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2017-06-16

AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

Application Note 2017-06-15

PDF PDF 3.96 MB
Critical Test Parameters of NB-IoT, Test Challenges and Keysight Solution - Application Note
This application note describes some of the most relevant features of NB-IoT, which make it a strong candidate among the different Low Power Wide Area Network (LPWAN) options through use of Internet of Things.

Application Note 2017-06-05

BenchVue Software as an Educational Tool - Application Note
Discover how BenchVue software is a powerful tool for instructional laboratories, as well as for instructors.

Application Note 2017-05-19

Using BenchVue Software’s Test Flow Application to Characterize Transistors - Application Note
This application note shows how to make a simple transistor curve tracer using a Keysight B2962A power source along with a Test Flow sequence running in Keysight’s BenchVue software.

Application Note 2017-05-16

Achieving Metrology-grade Results in Vector Network Analysis at Millimeter-wave Frequencies
Millimeter-wave expertise and new solution for design, simulation, test and analysis in millimeter wave frequencies.

Application Note 2017-05-12

Previous 1 2 3 4 5 6 7 8 9 10 ... Next