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Successful Deployment of eCall Live Crash Test - Case Study
Car maker successfully emulates over-the-air environments in live crash test for their emergency call in-vehicle systems, with the eCall/ERA-GLONASS conformance test solution from Keysight.

Case Study 2018-12-13

PDF PDF 5.10 MB
Electronics OEM Taps Keysight Automotive Radar Solution to Support Autonomous Driving R&D
Electronics manufacturer jumpstarts automotive radar application design and test efforts with Keysight solution, saving test development time and improving initial test coverage by over 50 percent.

Case Study 2018-11-26

PDF PDF 2.97 MB
Putting the Future in Motion with Automotive Ethernet
Continental adopts Keysight's automotive Ethernet test solution for 100BASE-T1, 1000BASE-T1, DDR memory, and USB connectivity compliance testing.

Case Study 2018-11-16

PDF PDF 3.30 MB
A Pilot Program in Internet-of-things with University and Industry Collaboration
University of New Haven in collaboration with Keysight Technologies have embarked on offering a sequence of two IoT courses to teach the concepts and functionalities of the IoT technologies.

Article 2018-09-04

PDF PDF 2.10 MB
DC-DC Converter Testing - Case Study
Manufacturer of automotive DC-DC converters slashes test time by 95 percent.

Case Study 2018-07-17

PDF PDF 4.49 MB
Completing Li-Ion Cell Self-Discharge Testing in Just Two Hour - Case Study
Leading Lithium-Ion cell manufacturer dramatically reduces overall battery test time and improves product quality assurance with innovative self-discharge tests from design to manufacturing.

Case Study 2018-07-04

PDF PDF 3.61 MB
Head-to-Head Comparison - Vectorless Test: NanoVTEP vs VTEP - Case Study
This case study summarizes some of the results of early tests conducted at customer sites, and includes results of controlled tests conducted in Keysight’s R&D lab.

Case Study 2018-06-05

PDF PDF 3.39 MB
Keysight Translator for QDART Test
Keysight Translator software for QDART

Article 2018-01-30

Vectorless Test EP (VTEP) Goes Head-to-Head with Keysight TestJet - Case Study
VTEP has proven its abilities to improve in-circuit test coverage by over 80 percent compared to the older TestJet technology, especially on boards with hard-to-test packages such as BGAs, micro-BGAs, and SMT edge connectors.

Case Study 2017-12-01

PDF PDF 1.64 MB
Mini ICT with VTEP Accurately Detects Solder Failure on SMT Connector - Case Study
Find out how one customer reported reduction in bone pile and significant savings on scrap cost after using the Mini ICT systems with VTEP

Case Study 2017-07-24

PDF PDF 779 KB
i3070 Inline ICT Improves Functional Test Yield of SSDs - Case Study
Find out how one customer reported first pass yield results of more than 95% with less than 0.5% false failures, after installing the i3070 Series 5 Inline ICT systems.

Case Study 2017-07-10

PDF PDF 610 KB
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

Article 2017-05-08

PDF PDF 624 KB
Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

Article 2017-04-01

PDF PDF 860 KB
HUAWEI demonstrates 112 Gb/s PAM-4 optical signal transmission with M8196A AWG
112 Gb/s PAM-4 Optical Signal Transmission over 100-m OM4 Multimode Fiber for High-Capacity Data-Center

Article 2016-12-05

Rehost Service for Keysight ICT, AXI and AOI systems
Rehost service is included as part of Keysight support agreement for hardware support or software subscription service.

Feature Story 2016-11-10

Accurate Spectrum Analysis Up to THz with Your Vector Network Analyzer - White Paper
This white paper will focus on the addition of the new PNA spectrum analyzer capability into the MMW and sub-MMW VNA solution including the technology that made it possible and how it is accomplished.

Article 2016-07-26

PDF PDF 4.12 MB
Benefits of Keysight Bead Probe Technology
Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.

Article 2016-03-03

Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint
Early implementation of BST can cut test costs and time.

Article 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

Article 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

Article 2016-02-16

PDF PDF 409 KB
ABCs of Writing a Custom Boundary Scan Test - Article Reprint
This article provides sample vectors and code for expanding test coverage with boundary scan.

Article 2016-02-12

PDF PDF 472 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

Article 2016-02-12

PDF PDF 178 KB
Tester for Hire - Article Reprint
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

Article 2016-02-09

PDF PDF 381 KB
Testing the Internet of Things - Article Reprint
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

Article 2016-02-09

PDF PDF 79 KB
Manufacturing Test Solutions for SSDS - Article Reprint
A new system performs both ICT and boundary scan in high-volume settings.

Article 2016-02-09

PDF PDF 222 KB

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