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Nanotribology of Hard Thin Film Coatings: A Case Study Using the G200 Nanoindenter
Case study of the changes in elastic modulus and hardness of thin film as measured using the nanoindenter and the continuous stiffness measurement option, which measures the mechanical properties as a continuous function of depth.

Application Note 2013-09-30

PDF PDF 469 KB
In Situ Electrochemical Measurements Using the 7500 AFM - Application Note

Application Note 2013-09-27

PDF PDF 178 KB
Single Molecule Force Spectroscopy (SMFS) Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 285 KB
Elastic Modulus Mapping Using the 7500 AFM - Application Note

Application Note 2013-09-24

PDF PDF 138 KB
Reliable Temperature Chamber Testing with N2797A Extreme Temperature Active Probe - Application Note
Keysight’s N2797A extreme temperature active probe can operate over wide temperature ranges from -40 to 85 C, improving the accuracy of your temperature chamber measurements.

Application Note 2013-09-19

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
Vapor Annealing Effect on Copolymers Studied by 7500 AFM with Environmental Control-Application Note

Application Note 2013-09-16

PDF PDF 116 KB
Surface Potential Measurements Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-13

PDF PDF 452 KB
7500 AFM Applications in Polymer Materials - Application Note

Application Note 2013-09-12

PDF PDF 186 KB
Current Sensing AFM Measurements Using 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 98 KB
Magnetic Force Microscopy Studies Using the Keysight 7500 AFM - Application Note

Application Note 2013-09-12

PDF PDF 287 KB
Humidity-dependent Surface Chemistry Studied by 7500 Atomic Force Microscopy - Application Note

Application Note 2013-09-12

PDF PDF 117 KB
The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
RS-232 Troubleshooting - Application Note
In the course of dealing with personal computers, you may use the RS-232 serial interface. This application note will describe RS-232 at a basic level, with an orientation towards Windows®- based instrument programming.

Application Note 2013-07-31

PDF PDF 111 KB
Configuring Boundary Scan Chains on Keysight x1149 Boundary Scan Analyzer - Application Note
This application note provides the procedure for configuring the boundary scan chain of a board using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-30

PDF PDF 890 KB
Solutions for Testing NFC Devices
Using an accurate, configurable and versatile test bench with qualified test tools to address test challenges throughout the NFC product development cycle

Application Note 2013-07-29

Merging boards on Keysight x1149 Boundary Scan Analyzer – Application Note
This application note shows how to connect two or more boards to form a single boundary scan chain using the Keysight x1149 boundary scan analyzer.

Application Note 2013-07-26

PDF PDF 1.85 MB
Achieve Accurate Two Wire Resistance Measurements with the Keysight 34923A and 34924A Multiplexers -
This application note provides an overview of how to make an accurate two-wire resistance measurement with the Keysight 34980A and a multiplexer.

Application Note 2013-07-24

Oscilloscope Selection Tip 11: Probing - Application Note
Tip 11: Select an oscilloscope from a vendor that can also provide the variety of specialty probes that you may require.

Application Note 2013-07-24

PDF PDF 638 KB
Overcome PCB Loss, Deliver a Clean Eye to Your DUT Using Multi-tap De-emphasis - Application Brief
This application brief describes how Keysight’s 32 Gb/s Pattern Generator with integrated 5-tap de-emphasis can overcome PCB and connector loss and deliver a clean eye to the DUT.

Application Note 2013-07-16

Active Device Characterization in Pulse Operation Using the PNA/PNA-X - Application Note
This AN discusses pulsed S-parameter measurements using the PNA-X series and measurement techniques that enable power-dependent active device characterization including compression and distortion.

Application Note 2013-06-19

In Vitro Complex Shear Modulus of Bovine Muscle Tissue - Application Note
Overview of how dynamic instrumented indentation provides a way to measure the mechanical properties of soft biological tissue

Application Note 2013-06-17

PDF PDF 1.09 MB
MOI for SATA RSG Tests, SATA Interoperability Program Rev. 1.5 - Application Note
Serial ATA Interoperability Program Revision 1.5 Keysight MOI for SATA RSG Tests

Application Note 2013-06-10

PDF PDF 2.45 MB
Evaluating High-Resolution Oscilloscopes - Application Note
This application note talks about: . How scope ADC bits and bits of resolution differ . Relationship between vertical resolution and noise . How high-resolution mode works . Average mode

Application Note 2013-05-07

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