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Testing Automotive DC-DC converter with Keysight TS-8989 - Application Note
This paper discusses emulation of input signals, load simulations and measurements for testing high-power automotive DC-DC converter electronic control units and the TS-8989 functional tester.

Notes d’application 2018-04-12

How to Shorten Li-Ion Self-Discharge Test Time? - White Paper
High levels of Li-Ion cell self-discharge are indicative of latent failures. The new potentiostatic solution from Keysight addresses cell self-discharge measurement challenges with revolutionary reduction in time, save cost and accelerate time-to-market.

Notes d’application 2018-01-26

Drive Connected, Drive Safe - White Paper
A well-tested eCall/ERA-Glonass system meeting compliance standards at development phase can go on to help save lives and minimize injury aftermath in the event of accidents when cars hit the roads.

Notes d’application 2017-12-13

TS-8989 System Integration Guide - Application Note
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Notes d’application 2017-12-12

Measure Lithium Ion Self-Discharge of Cells in a Fraction of the Time Traditionally Required
This new way to determine a cell’s self-discharge by measuring its self-discharge current allows cells with excessively high self-discharge to be identified and isolated much quicker vs traditional open-circuit voltage approaches.

Notes d’application 2017-12-08

x1149 Boundary Scan Solution for Blade Server Board - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Notes d’application 2017-12-01

Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.

Notes d’application 2017-07-31

Automotive FMCW Radar System Design using 3D Framework for Scenario Modeling
Automotive Radar Architects can take advantage of Keysight SystemVue’s 3D simulation framework, radar reference designs, and links to MATLAB and T&M equipment to model FMCW radar system scenarios.

Notes d’application 2017-03-28

Understanding x1149 Integrity Test - Application Note
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Notes d’application 2017-02-16

Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

Notes d’application 2015-05-11

Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

Notes d’application 2015-01-05

Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Notes d’application 2014-08-03

Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

Notes d’application 2014-03-26

Testplan Development on CVI Labwindows with TS-5400 PXI Series - Application Note
This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

Notes d’application 2014-03-25

Make High Sensitivity, Wide Dynamic Range Current Measurement - Application Note
The new N2820A Series high-sensitivity current probes from Keysight Technologies address the need for high-sensitivity current measurements with a wide dynamic range.

Notes d’application 2013-02-26

Reducing Measurement Times in Antenna and RCS Applications
To help you achieve these speed improvements, this note describes test range configurations and typical measurement scenarios.

Notes d’application 2010-12-20

Network Parameter Measurement: Best Practices using the Keysight Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Keysight Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Notes d’application 2009-04-02

Quad Flat No Lead (QFN) Best Practices
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Notes d’application 2008-08-26

The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

Notes d’application 2007-10-31

Tips for X-ray Users On Exporting NDF’s With No Loads Set To False
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.

Notes d’application 2007-10-18

X-ray Test Users Utilize BOM Explorer to Change
Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested".

Notes d’application 2007-10-12

Making the Most of Keysight Throughput Multiplier on Medalist In-Circuit Test Systems
Keysight Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.

Notes d’application 2007-10-12

Medalist SP50 User Tips for Nominal Paste Factor Field
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.

Notes d’application 2007-10-11

PNA - Antenna - Pulsed Measurements
This paper presents advances in the instrumentation techniques that can be used for the measurement and characterization of antennas that are to be tested in a pulsed mode of operation.

Notes d’application 2004-01-06

Fundamentals of Modal Testing (AN 243-3)
This modal test 56 page Application Note provides an verview of structural dynamics theory, the measurement process for acquiring frequency response data, parameter estimation (curve fitting), and the analytical techniques of structural analysis and their relation to experimental testing (such...

Notes d’application 2000-05-01

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