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IoT Devices Measurement Insights

See more at HOTSPOTS Homepage

IoT Devices Measurement Insights
Agenda
Register (at the bottom of the page)
Welcome & Overview – Keysight
Maximizing IoT Device Battery Life
Networking and refreshment break
Analyzing IoT Device Power Integrity               
Lunch break
Overcoming IoT Wireless Design and Test Challenges
Networking and refreshment break
Hands-on and demonstrations

Papers & Abstracts

Overview of Keysight IoT Seminar

“Enabling Insight into the Design, Development and Validation of IoT devices”

The IoT is revolutionizing how we live, and is built on increasingly complex technologies. IoT devices can carry the processing power of an early supercomputer; they are sometimes powered by coin cells that are expected to last more than 10 years. Poor reliability can lead to expensive service bills, product recalls, and unhappy customers. Can your designs withstand the rigors of the real world?

Keysight's Internet of Things (IoT) Seminar addresses the rising challenges facing engineers designing and developing devices for IoT applications, with reliable and accurate test and measurement solutions, enabling faster time-to-market and successful implementations in the real world.

Three focused papers will give you deeper insight on how to achieve best battery life and energy efficient designs, clean power rails for reliable device operation, and overcoming wireless challenges. Technology booths will be available throughout the seminar to provide you the opportunity to interact with Keysight experts and products/solutions.

Maximizing IoT Device Battery Life

“Insight into longer battery run-time and energy efficient designs”

IoT devices are often battery or self-powered and have limited energy storage. To optimize battery run-time, it is important to measure, analyze, and optimize battery drain at all phases of your device’s development, which includes both hardware and software. Techniques such as current drain profiling and analysis can help you achieve optimal balance between performance and power consumption. You will learn how you can measure wide dynamic current range seamlessly from sleep to active, identify critical RF/DC events that contribute most to power consumption, and a better way to power your devices during test and development.

Analyzing IoT Device Power Integrity

“Insight into solving power integrity issues with Infiniium Oscilloscopes and Power Rail Probes”

With increased functionality, higher density, higher speed and lower power electronics, power integrity issues are becoming common as the tolerance reduces. To ensure clean power rails, supply lines need to be examined for quality and integrity. The challenge is to measure small and fast AC signals riding on top of their DC supplies. We start with the basics before moving on to advanced measurement, analysis, and prediction techniques. One of the goals is you will learn how to debug and test power distribution networks (PDN) with more precision.

Overcoming IoT Wireless Design and Test Challenges

“Insight into solving wireless design and test challenges in the real world”

To serve the diverse nature and needs of IoT applications, numerous wireless technologies and standards have emerged. Varied networks can support applications ranging from simple battery-powered sensors to the low-latency, high-bandwidth, mission-critical services. As devices need to support multiple standards, testing these devices becomes increasingly complex. The high density of connected devices sharing similar frequency bands can also cause co-channel and adjacent channel interference with each other. We will address these three wireless test challenges: multi-format wireless testing, compliance testing, and managing RF and wireless devices.
 

Register for one of the events by clicking on the appropriate link in the table below.

Alternatively, receive notifications of future IoT Devices Measurement Insights HOTSPOTS Seminars as they become available by clicking ‘Notify me’.



 
Where & When
 

Date(s) Location Seminar's Language For more information