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Device Modeling Learning Week in UK

Why is device modeling important?

If you want to understand the principles to perform reliable baseband and RF measurements, then seamlessly extract device model cards while being able to take into account reliability and statistics or portability on commercial EDA simulators, or if you want to understand the challenges of the recent advances in compact modeling (BSIM6/BSIM-CMG…), then join us for the next Device Modeling Learning Week in Winnersh, United Kingdom, from Monday 2nd until Friday 6th February 2015.

Over the five days course we will offer a continuous series of lectures and hands-on labs covering basic and advanced topics of device characterization and device modeling using IC-CAP and MBP. The schedule is modular, allowing you to choose any combination of topics. You can register for one or more days at your convenience. These classes will be led by an Keysight Device Modeling expert. Computers will be provided by Keysight, but you are also invited to bring your own laptop. In this case, we will provide you with the installation software and temporary codewords before the start of the Event. Participating with your own computer will enable you to e.g. apply the discussed topics, macros or GUIs directly to your own measurement data. Please find below the registration information and the detailed agenda. The cost of classes is £400 per day, including lunches and refreshments. Seating is limited and will be assigned on a first-come, first-serve basis.

 

European Device Modeling training Detailed Agenda
 

   Monday

     9:30
       |
   17:30

 

Making reliable Baseband and RF Measurements

  • DC measurements tutorial:
    Force-Sense technique, shielding, self-heating, self-oscillation, handling DUTs with big capacitances.
  • CV measurements tutorial:
    Measurement principle, how to handle unused pins during measurements and simulations, max. signal level, the right CV frequency, max. DC bias.
  • S-parameter basics for modeling engineers:
  • NWA measurements tutorial:
    Accounting for DC bias losses, max. applicable RF signal, NWA calibration & verification, de-embedding and its verification, data consistency checks.
  • Automating on-wafer measurements :
    Keysight WaferPro/DataPro

  Tuesday

     9:00
       |
   17:30

 

Introduction to IC-CAP

  • Modeling Overview
  • IC-CAP User Interface and Model Structure
  • Linking to DC, CV and RF Instruments
  • Measurements and Data in IC-CAP
  • Model Extraction
  • Circuits, Simulation and Optimization
  • Plot Features and Using the Plot Optimizer
  • PEL Programming for Custom Extraction and Automation
  • Build and Run a Diode Model Extraction

Wednesday

      9:00
        |
    17:30

 

Getting further with IC-CAP

  • Device Modeling extensions (sub-circuits, Verilog-A) 
    Verilog-A Model of a diode
    Keysight ICCAP Toolkits : example on GaN FET Modeling
  • Programming in ICCAP and creating GUIs (Graphical User Interfaces): 
    PEL/Python commands, variables & strings & arrays
    PEL/Python Programming: extracting Parameters, executing Programs, accessing data
    Setting up GUIs and execute them from programs
     

 Thursday

      9:00
       |
    17:30

 

Extending models robustness with Keysight MBP

  • Measurements loading
    One-click loading and simulation of (anyone’s) .mdm data files
    Turn-key extraction flows
    Automatic model extraction flows for advanced technologies (BSIM-CMG, BSIM6, HiSIM-HV, PSP, etc.)
    Manual fine tuning and optimization of model parameters
    Binned modeling made easy
    Layout proximity effect (LPE) modeling
  • Increasing models’ robustness
    Target-based (aka speculative, re-centering, or guess) modeling
    Statistical model extraction: mismatch and global variations
    Corner modeling
    Parameter tuning and optimization with a device model library
  • Reporting
    Automatic generation of model extraction report
     

    Friday

      9:00
        |
    17:00
 

Qualifying model libraries with Keysight MQA

  • MQA basics
    Single model QA, comparison with measurements
    Comparing different models or different simulators
    Report generation
  • MQA Advanced
    Creating your own basic rules
    Creating circuit-level rules
    Script-based rules
    Automating QA
     

 

Where & When

Price Date(s) Location For more information
£400 per day 2015-02-02 09:00 - 2015-02-06 17:00 Local Time Keysight Technologies, 610 Wharfedale road, Winnersh, Wokingham, United Kingdom