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Advanced Measurement Seminar 2018

* See dates and locations below


Today's engineers working in communications, consumer electronics and aerospace-defense are faced with increasingly complex measurement challenges. Join our experts as they discuss the latest VNA measurement applications targeted at complex active and non-linear devices such as power amps , active antennas and Doherty Amplifiers as well as the latest cutting-edge 5G NR design validation techniques.


This full day seminar will include a series of lectures, interactive discussions, and product demonstrations. Morning refreshments and lunch will be provided.





Tuesday, September 11, 2018

Mississauga Convention Centre
75 Derry Road
Mississauga, ON L5W 1G3

Thursday, September 13, 2018

Holiday Inn Select Kanata
101 Kanata Ave.
Ottawa, ON K2T 1E6

Friday, September 14, 2018

Novotel Montréal Aéroport
2599 Boul. Alfred Nobel
Ville St-Laurent, QC H4S 2G1

Wednesday, October 17, 2018

The Element Vancouver Metrotown
5988 Willingdon Avenue
Burnaby, BC V5H 2A7


8:30 a.m. | Registration/Refreshments

9:00 a.m. | - Improved Modulated Power Measurements Using Coherency
Making accurate power measurements on modulated signals, particularly for the distortion found in ACPR and NPR measurements, can be difficult for lower levels of distortion. Using a VNA based spectrum analyzer, and adding the advantage of coherency to these measurements will greatly improve results. This paper will detail coherent modulated measurements, including discussion of modulation properties from arbitrary waveform analyzers.

9:45 a.m. | X-Parameter Load Pull for Power Transistor and PA Design and Validation
The S94521A arbitrary load control X-parameters (ALC) provides passive, active or hybrid load control for extracting X-parameter models far from 50 Ohms. This application is ideal for high power transistor/amplifier design and validation. During this session you will gain an understanding of the integration of ALC with NVNA software providing setup, dc I/V selection, measurement, analysis, and model extraction.

10:30 a.m. | Break and Product Fair

10:45 a.m. | Using Active Hot Parameters and X-Parameters to Improve Active Device Measurement Accuracy
Active hot parameters for PNA-X Series provides a more accurate method to test hot S-parameters, gain and output power than traditional methods by utilizing the X-parameter technology. It removes the active device and system interaction to precisely calculate the active parameters and output power into a nominal 50 ohm environment. It also provides coefficients of equation to calculate linear and non-linear device performance of gamma-opt (optimum), optimal load match and maximum delivered power to optimum load.

11:30 a.m. | Accuracy Matters!
What do you do with the result after you take a measurement? Often, people compare the result to a specification and make a “Pass” or “Fail” decision to ship or reject the item under test. They don’t teach you in school how accuracy affects the risk of incorrect Pass/Fail decisions. We will.

12:00 p.m. | Lunch and Product Fair
Provided by Keysight

1:00 p.m. | Accelerating Design Validation for 5G NR
This paper reviews key standards in 3GPP Rel 15 for 5G NR and key implications for equipment design and physical layer design validation. It explores new approaches to overcome the biggest challenges in both sub-6 GHz and mmwave spectrum and walks through solutions via case studies for signal quality, fixturing and calibration, multi-domain probing, MIMO/beamforming, and test acceleration techniques using the cloud and data analytics. This workshop will enable RF/mmWave designers, test and validation engineers, and engineering managers to find new insights from the latest trends in 5G, in order to modernize and accelerate their own product development workflow.

2:00 p.m. | Measuring Noise Fig of Active Antennas
Active antennas, particularly phase-array and electronically-steerable-antennas (ESA) presents a challenge to measurement of their effective noise figure. For active antennas, the figure of merit for noise is G/T or gain over noise temperature. This paper presents a new method, based on PNA-X noise figure measurements, that can directly measure the G/T for active, phased-array antennas.

2:30 p.m. | Break and Product Fair

2:45 p.m. | Doherty Amp Characterization Using the Differential and I/Q Measurement Application
Doherty amplifiers generate improve PAE based on the combining of a main-signal amplifier with a peaking amplifier, that are both driven with a sample of the input signal. It is critical that the peaking amplifier have the proper gain and phase for proper peaking, but this can be difficult to determine. A new measurement application, DIQ, can provide a simple, yet accurate way to find optimum operation by driving the inputs individually with independent phase and amplitude control. Extensions to other amplifier configurations will be outlined as well.

3:30 p.m. | Closing Comments and Q & A


Joel Dunsmore, R&D Engineer, Keysight Technologies

Since graduating from Oregon State University with an MSEE (1983), Joel Dunsmore has worked for Keysight Technologies (formerly Agilent and Hewlett-Packard) at the Santa Rosa Site. He received his Ph.D. from Leeds University in 2004. He is a Keysight R&D Fellow focused on component test. He was a principle contributor to the HP 8753 and PNA family of network analyzers, responsible for RF and Microwave circuit designs in these products. Recently, he has worked in the area of non-linear test including differential devices, and mixer measurements, as well as modulated and spectrum measurements. He has received 26 patents related to this work, and authored the “Handbook of Microwave Component Measurements”. He co-taught an RF course at the University of California, Berkeley, and presented several short courses and seminars through ARFTG, MTT and Keysight


* You will be asked to select date and location upon registration