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Laser Test of RIN, Linewidth and Optical Noise Parameters Webcast

1   Hour | Webcast - recorded | Where & When


The increasing capacity of optical transmission systems using closely spaced DWDM and high-level modulation schemes requires lasers with exceptional noise performance. Required parameters are relative-intensity noise (RIN), laser linewidth, and optical frequency noise for which Sycatus products are designed to measure these parameters.

This webcast will discuss the measurement techniques, describe the operation, and review measurement data on typical high-performance lasers.


This webcast will be of interest to researchers, developers and manufacturers of lasers used in high-capacity telecommunications equipment. It will also be of interest to equipment manufacturers who are procuring and testing such lasers.


Jake Weise, Founder and President, OgMentum Incorporated. An exclusive distributor of Sycatus products

Jake Weise has over 20 years of experience in sales and marketing, including more than 15 years in fiber optics. Mr. Weise brings a broad knowledge of many aspects of product marketing, including market research, product definition and positioning, message communication, and modeling. His worldwide customer network includes large and smaller companies in telecommunications, data communications, semiconductor, and instrumentation.


Makoto Shikata, President, Sycatus Corporation

Makoto Shikata was born in Ibaraki, Japan. He received the B. S. degree in applied physics from Tokyo University, Japan in 1986. He then joined Oki Electric Industry’s Semiconductor Technology Laboratories where he designed high-speed compound semiconductor logic ICs. In 1999 he received the Ph. D. degree in applied physics from Tokyo University. In 2000 he joined Agilent Technologies where he developed optical measurement systems such as Lightwave Component Analyzer or RIN Measurement System. In 2009 he established SYCATUS Corporation where he managed the enhancement of RIN Measurement System and the development of Optical Noise Analyzer. Dr. Shikata is a member of IEEE and IEICE.


Jack Dupre, Applications Engineering Manager, OgMentum Incorporated

Jack Dupre has 20 years of experience in developing products and test methods for the fiber-optic industry. He joined Hewlett-Packard Co. in 1964 as a microwave development engineer and subsequently managed the development of RF and microwave sweep oscillators, spectrum analyzers, and lightwave instruments for both Hewlett-Packard and Agilent Technologies. Jack holds a BSEL from California State Polytechnic University, San Luis Obispo, and an MSEE from Stanford University. As part of his consulting activity, Jack is currently secretary for IEC Subcommittee 86C, Fibre optic systems and active devices, which develops international standards.

Where & When

Price Location For more information
Free At Your PC Enroll to view the January 29, 2015 recorded broadcast 

Prices shown are list prices and are subject to change without notice.

Training & Event Materials

Laser Test of RIN, Linewidth and Optical Noise Parameters Webcast Slides 
Slides from the January 29, 2015 webcast

Seminar Materials 2015-01-29