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Millimeter-wave Component Characterization Webcast

1   Hour | Webcast - recorded | Where & When


With the increased demand for the transfer of large volume of data at high speeds, there is an increasing need to utilize the millimeter wave frequency band . This places an increased demand on designers and manufacturers in the industry to fully characterize and test both active and passive components at the millimeter wave frequencies. This webcast will focus on how a Vector Network Analyzer can be utilized to address the need for millimeter wave component characterization for both passive and active devices.


Engineers developing RADAR, EW, Satellite, or digitally modulated communication system receivers and transmitters.


Suren Singh, Industry Applications Specialist, Keysight Technologies

Suren Singh received his BSEE from University of Durban-Westville, Durban South Africa in 1985. He completed a Graduate Diploma at the University of Witwatersrand, Johannesburg South Africa in December 1992. He then went on to complete his MSEE at the University of Witwatersrand, Johannesburg in 1995. Suren has been with the Hewlett-Packard Company, Agilent Technologies and now Keysight Technologies since 1986. His experience at Keysight includes application engineering, product design, manufacturing and test process development for microwave hybrid microcircuits. He currently holds the position of industry application specialist focused on millimeter wave measurement solutions and applications. Currently an IEEE member and presented several papers at IEEE conference on materials and 5G testing. In addition, he is responsible for the metrology products for performance network analyzers, including both calibration and verification.

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Free At Your PC Enroll to view the September 7, 2017 recorded broadcast 

Prices shown are list prices and are subject to change without notice.