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Test at Breakneck Speeds with System Power Supplies Webcast

1   Hour | Webcast - Registrato | Where & When


Improving test throughput is a challenge most anyone involved with providing electronic products, assemblies, or components is faced with in order to remain competitive. Making even small improvements is deemed very worthwhile as it reduces cost in a number of direct ways, such as operator test time, and indirect ways, such as improved workflow. Often overlooked, learn how the test system DC power supply can have a large impact on test time in a multitude of ways, from fundamental speed performance differences that can take seconds off test time, to advanced capabilities that can squeeze every last millisecond out of that specialized component test need!



Engineers performing tests in development, design validations, and manufacturing where improving test throughput is a critical goal


Russ Clegg, Application Engineer | Automotive and Energy Solutions

Russell Clegg is an Application Engineer for Automotive and Energy solutions. He has been with Keysight Technologies for over 30 years and during this time he has worked as a Production and Test Engineer, EMC Engineer, R&D Engineer and a Product Application and Support Engineer. Russell holds a BS degree in Electrical Engineering from New Jersey Institute of Technology.

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Free At Your PC Enroll to view the March 30, 2017 recorded broadcast 

Prices shown are list prices and are subject to change without notice.