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Scaling Up the Photonic Integrated Circuit Industry with Optimized Test Methods Webcast

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Progress in photonic integrated circuit (PIC) technology and applications is accelerating with the onset of an industrial ecosystem comprised of InP and SiP foundries, commercial modeling tools, and photonic test capability. Bringing optical test deeper, from package level into the semiconductor process, is an important step to assure performance and yield. A key aspect of testing at the wafer, bar, and chip stage is fast reproducible optical coupling, including probe-position optimization and polarization alignment. Advanced methods and instruments developed for the fiberoptic communications industry are now being adapted for this new environment.

In this webcast we will give an introduction to PICs and the silicon photonic industry as well as current challenges which must address a mixture of DC, RF, and photonics testing.



Design engineers, photonic test engineers, application engineers, process engineers, validation engineers, photonic system designers, photonic IC designers, datacenter and photonic communication architects, project managers, program managers, and application managers.


Doug Baney, Department Manager, Keysight Laboratories

Dr. Douglas Baney has been in the field of microwaves and photonics for the past 35 years. He worked as an R&D millimeter wave engineer in Hewlett-Packard’s Signal Analysis Division, and later transferred to HP Laboratories, then Agilent Laboratories and now Keysight Laboratories where he conducted research in the areas of optical amplifier gain, optical noise figure, and spectral-hole burning and upconversion ZBLAN fiber lasers. Many of the optical amplifier test methods he developed are in use globally for production test of optical amplifiers. Other research he performed or directed includes Faraday-effect optical devices, optical reflectometry, optical coherent reception, and advanced modulation format optical constellation measurement. He also led the research team that developed the first high-volume commercial laser-based mouse.

He is currently a department manager in Keysight Labs responsible for research in microwave test, nonlinear microwave modeling, nanomeasurement, measurement automation, photonics measurement, and integrated photonics applications.

He holds a Ph.D. from Télécom ParisTech, Paris, France, MSEE from the University of California, Santa Barbara, and BSEE from Cal Poly, San Luis Obispo. He served as General Co-Chair of OFC, General Co-chair of OAA , OSA OFC Budget Committee, Tyndall Award Committee and is a Fellow of the IEEE.

Joe Frankel, Systems Engineer, FormFactor/Cascade Microtech

Joe Frankel hails from the Pacific Northwest and holds a Bachelor's Degree in Mechanical Engineering from the University of Idaho and a Master's Degree in Automation and Mechatronics from the Georgia Institute of Technology. Prior to joining FormFactor/Cascade Microtech, Joe worked as a systems and motion control engineer at Electro-Scientific Industries from 2004 to 2014 designing, building and controlling high speed laser processing systems serving the semiconductor, flat panel, and consumer electronics industries. Since joining FormFactor in 2014 Joe has functioned as a systems engineer with a focus on probe station automaton.

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Free At Your PC Enroll to view the September 13, 2017 recorded broadcast 

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